The Advantest Q8384 is a high-end optical spectrum analyzer designed for precise measurement and evaluation of wavelength characteristics in fiber optic communications. Utilizing a high-performance monochromator, it delivers exceptional wavelength resolution and accuracy in the 1.55 µm band, combined with a wide dynamic range and the ability to accept high-power optical inputs directly. It includes diverse WDM analysis functions and EDFA noise figure measurements.
Specifications
General
| Parameter | Value |
|---|---|
| Interfaces | GPIB |
| Display | 10.4-inch color LCD |
| Storage | 3.5-inch floppy disk drive |
Physical
| Parameter | Value |
|---|---|
| Operating Temperature | +10 to +40 |
Wavelength Specifications
| Parameter | Value |
|---|---|
| Wavelength Range | 600 nm to 1700 nm |
| Minimum Wavelength Resolution | 10 pm (in 1.55 µm band) |
| Wavelength Accuracy | ±20 pm (in 1.55 µm band) |
Dynamic Range & Optical Rejection
| Parameter | Value |
|---|---|
| Dynamic Range (Peak ± 0.1 nm) | 50 dB |
| Dynamic Range (Peak ± 0.2 nm) | 60 dB |
Measurement & Analysis Functions
| Parameter | Value |
|---|---|
| WDM Analysis | Supported |
| EDFA / Optical Amplifier Analysis | Supported (Measurement of NF noise indices) |
| Pass/Fail Limit Testing | Supported (Limit line function with Pass/Fail judgment) |
Inputs & Outputs
| Parameter | Value |
|---|---|
| Optical Input Connector | Universal adapter system |
Optical Input
| Parameter | Value |
|---|---|
| Applicable Fiber | Single-mode (SM 9/125 µm) / Multimode (GI 50/125 µm) |
Amplitude / Level
| Parameter | Value |
|---|---|
| Level Accuracy | ±0.4 dB (at -20 dBm input, 1310/1550 nm) |
| Polarization Dependence | ±0.05 dB (1520 to 1620 nm band) |
| Level Linearity | ±0.05 dB (-50 to +10 dBm, 1550 nm) |
| Sensitivity | -87 dBm (1200 to 1600 nm, 0.1 nm resolution) |
Performance
| Parameter | Value |
|---|---|
| Measurement Time (Sweep Speed) | 0.5 seconds (Span 500 nm) |
Technology
Monochromator-based Optical Spectrum Analysis
Applications
DWDM system evaluation, EDFA noise figure measurement, optical component characterization