The Advantest R3261A is a high-performance RF Spectrum Analyzer covering a frequency range of 9 kHz to 2.6 GHz. It is designed for analyzing RF signals with high accuracy, featuring a 1 Hz tuning resolution, built-in frequency counter, and a wide dynamic range. With standard GPIB connectivity, it is well-suited for automated test environments and manual laboratory measurements.

Specifications

General

ParameterValue
InterfacesGPIB (IEEE-488) standard
DisplayCRT display (green monochrome)
Warm-up Time30 minutes

Physical

ParameterValue
Power Supply100 to 120 VAC / 220 to 240 VAC (switchable), 50/60 Hz, ≤ 150 VA
Operating Temperature0 to 50 °C
Dimensions (W×H×D)355 mm × 177 mm × 450 mm
Weight15

Frequency

ParameterValue
Frequency Range9 kHz to 2.6 GHz
Tuning Resolution1 Hz
Frequency Span Range1 kHz to 2.6 GHz, and 0 Hz (zero span)
Reference Frequency Stability (Aging)±2 × 10^-6 / year
Reference Frequency Stability (Temperature)±5 × 10^-6 (0 °C to 50 °C)
Residual FM< 20 Hz p-p / 0.1 s
SSB Phase Noise≤ -105 dBc/Hz @ 20 kHz offset
Frequency Counter Resolution1 Hz to 1 kHz

Amplitude

ParameterValue
Amplitude Measuring Range-130 dBm to +25 dBm
Maximum Safe RF Input Level+25 dBm (with ≥ 10 dB attenuation)
Maximum DC Input Voltage0 VDC
RF Input Attenuator Range0 dB to 70 dB (10 dB steps)
Log Display Range100 dB, 50 dB, 20 dB, 10 dB
Linear Display Range10% of reference level / division
Amplitude UnitsdBm, dBµV, dBmV, V, W
Reference Level Range (Log)-109.9 dBm to +40.0 dBm
Display Scale Fidelity (Log)+/- 1.5 dB over 0 to -70 dB, +/- 1.0 dB over 0 to -50 dB, +/- 0.2 dB over 0 to -10 dB
Display Scale Fidelity (Linear)+/- 5% of full scale

Bandwidth

ParameterValue
Resolution Bandwidth (RBW) Range30 Hz to 1 MHz (1-3 sequence)
Video Bandwidth (VBW) Range1 Hz to 1 MHz (1-3 sequence)

Sweep

ParameterValue
Sweep Time Range50 ms to 1000 s
Sweep Trigger SourcesFree Run, Line, Single, Video, External

Signal Processing

ParameterValue
Trace DetectorsPositive Peak, Negative Peak, Sample
Trace Storage Capacity2 traces (Trace A, Trace B)

Inputs & Outputs

ParameterValue
RF Input Connector TypeType-N female
RF Input Impedance50 Ω
RF Input VSWR≤ 1.5 (for ≥ 10 dB input attenuation)
External Reference Input10 MHz, -10 dBm to +5 dBm, 50 Ω
Calibration Output Signal20 MHz, -20 dBm
Probe Power Output±15 V, max 100 mA
Headphone Output8 Ω minimum impedance, mini-jack
Direct Plotter OutputSupported via GPIB
External Trigger InputBNC female, TTL level
Gate InputBNC female, TTL level
Monitor OutputBNC, composite video signal

Display & System

ParameterValue
Memory Card SlotJEIDA memory card slot (for state and trace storage)
Marker FunctionsPeak Search, Next Peak, Delta Marker, Signal Track

Physical & Environmental

ParameterValue
Storage Temperature Range-20 °C to +60 °C
Relative Humidity≤ 85% (non-condensing)

Power & Electrical

ParameterValue
AC Power Input Voltage Range90 to 132 VAC / 198 to 250 VAC (automatic selection)
AC Power Frequency Range50 / 60 Hz

Spurious Responses

ParameterValue
Second Harmonic Distortion<= -70 dBc (for input level <= -30 dBm, frequency >= 10 MHz)
Third-Order Intermodulation Distortion<= -70 dBc (for two -30 dBm inputs, separation > 100 kHz, frequency >= 10 MHz)
Residual Responses<= -100 dBm (with 50 ohm termination, 0 dB input attenuation, frequency >= 10 MHz)

Receiver & Demodulation

ParameterValue
DemodulationAM and FM (built-in speaker and headphone jack)

Power Requirements

ParameterValue
Power Consumption<= 150 VA

Options

ParameterValue
Option 21 Reference Aging Rate±2 × 10^-8 / day
Option 21 Reference Temperature Stability±5 × 10^-8 (0°C to 50°C)
Option 11 QP Detector Bandwidths200 Hz, 9 kHz, 120 kHz (CISPR compliant)

Performance

ParameterValue
Built-in Measurement FunctionsOccupied Bandwidth (OBW), Adjacent Channel Power (ACP), 3rd Order Intermodulation, dB Down Bandwidth
1 dB Gain Compression≥ -10 dBm (at mixer input)
Sweep ModesSingle, Continuous, Manual

Technology

Analog & Digital RF Synthesis / Heterodyne Spectrum Analysis

Applications

RF Signal Analysis, Spectral Measurements, and Transmitter Testing

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