AQ6317B

Ando*misc

The Ando AQ6317B is a high-performance optical spectrum analyzer (OSA) designed for the measurement and evaluation of WDM transmission systems, laser diodes, optical fibers, and passive components. Operating over a broad wavelength range of 600 nm to 1750 nm, it features a double-pass monochromator that delivers high resolution and wide dynamic range. With exceptional wavelength accuracy, precise level flatness, and a variety of built-in analysis functions, the AQ6317B serves as a benchmark instrument for optical fiber communications testing.

Specifications

General

ParameterValue
InterfacesGP-IB (two ports: GP-IB1 and GP-IB2), VGA video output, analog output, external keyboard port
Display9.4-inch color active matrix LCD, 640 × 480 resolution
Warm-up TimeApprox. 1 hour
Built-In PrinterHigh-speed thermal printer

Physical

ParameterValue
Power Supply100 to 120 V AC / 200 to 240 V AC, 50/60 Hz, approx. 150 VA
Operating Temperature10°C to 40°C
Dimensions (W×H×D)426 mm × 221 mm × 450 mm
WeightApprox. 30 kg

Wavelength Performance

ParameterValue
Wavelength Range600 nm to 1750 nm
Wavelength Accuracy (1520 to 1580 nm)±0.02 nm
Wavelength Accuracy (1580 to 1620 nm)±0.04 nm
Wavelength Accuracy (600 to 1750 nm)±0.5 nm
Wavelength Resolution Settings0.01, 0.02, 0.05, 0.1, 0.2, 0.5, 1.0, 2.0 nm
Wavelength Linearity (1520 to 1580 nm)±0.01 nm
Wavelength Linearity (1580 to 1620 nm)±0.02 nm
Wavelength Repeatability±0.005 nm (within 1 minute)
Wavelength Resolution Accuracy±3% (at 0.1 nm resolution, 1523 nm)
Minimum Wavelength Resolution0.01 nm

Level (Power) Performance

ParameterValue
Level Measurement Range (1200 to 1600 nm)-90 to +20 dBm (resolution ≥ 0.05 nm)
Level Measurement Range (1000 to 1200 nm)-85 to +20 dBm
Level Measurement Range (1600 to 1700 nm)-85 to +20 dBm
Level Measurement Range (600 to 1000 nm)-60 to +20 dBm
Level Measurement Range (1700 to 1750 nm)-60 to +20 dBm
Maximum Safe Input Power+23 dBm (total)
Maximum Input Power per Channel+20 dBm
Level Accuracy±0.3 dB (at 1550 nm, -20 dBm input, resolution ≥ 0.1 nm)
Level Linearity (-10 to -50 dBm)±0.05 dB
Level Linearity (-50 to -70 dBm)±0.10 dB
Level Flatness (1520 to 1580 nm)±0.1 dB
Polarization Dependency±0.05 dB (at 1550 nm)

Measurement Capabilities

ParameterValue
Dynamic Range (at ±0.2 nm)60 dB (at 1523/1550/1625 nm, resolution 0.01 nm)
Dynamic Range (at ±0.4 nm)70 dB (at 1523/1550/1625 nm, resolution 0.01 nm)
Sweep Time (Span ≤ 50 nm)0.5 s or less (resolution 0.1 nm, sensitivity Normal)

Connectivity & Ports

ParameterValue
Optical Input ConnectorFC-type (standard), SC-type or ST-type (optional)
Analog Output Voltage0 to 5 V (Y-axis output corresponding to level)

Software & Analysis

ParameterValue
Built-In Analysis FunctionsWDM analysis, DFB-LD analysis, FP-LD analysis, LED analysis, Spectral width analysis, Optical fiber amplifier (EDFA) analysis, PMD measurement

General Features

ParameterValue
Data Storage MediaInternal memory, 3.5-inch MS-DOS compatible Floppy Disk Drive (FDD)

Environmental

ParameterValue
Storage Temperature Range-10°C to 50°C
Operating Humidity Range80% RH or less (no condensation)

Performance

ParameterValue
Number of Sampling Points101 to 10001
Wavelength Display Resolution0.001 nm
Level Display Resolution0.01 dB
Level Scale0.1 to 10 dB/div, Linear

Optical Features

ParameterValue
Applicable Fiber TypeSingle-mode (9.5/125 µm), GI (50/125 µm, 62.5/125 µm)

Power

ParameterValue
Power ConsumptionApprox. 150 VA

Storage

ParameterValue
Internal Memory Capacity32 traces, 20 programs

Sweep Characteristics

ParameterValue
Sweep Span Range0 nm, 0.1 to 1150 nm
Sweep Sensitivity SettingsNORM_HLD, NORM_RNG, HIGH1, HIGH2, HIGH3
Sweep ModesSingle, Repeat, Auto

Optical Performance

ParameterValue
Dynamic Range (at ±1.0 nm)70 dB (at 1523 nm, resolution 0.05 nm)

Inputs & Outputs

ParameterValue
External Video OutputVGA (D-Sub 15-pin, on rear panel)

Data Storage

ParameterValue
PC Card SlotPCMCIA Type II (1 slot)

Interfaces

ParameterValue
Keyboard InterfacePS/2 (for external keyboard, on rear panel)

Technology

Optical Spectrum Analysis

Applications

Wavelength Division Multiplexing (WDM) testing, optical amplifier characterization, laser diode spectral analysis

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