The Keysight Technologies (formerly Agilent HP) 16522A is a high-performance 200 MHz digital pattern generator module designed for functional digital design testing. Compatible with Agilent 16500 and 16700 series logic analysis system mainframes, this module allows engineers to simulate real-world stimuli, run design qualification tests, and check system responses to unexpected signals or clock speeds, reducing the need for custom test hardware.

Specifications

Physical

ParameterValue
Power SupplyPowered by mainframe backplane
Operating Temperature0 to +55 °C
Weight1.4 kg

Stimulus & Pattern Generation Performance

ParameterValue
Maximum Clock Rate200 MHz
Number of Channels per Module20 channels (at 200 MHz clock) or 40 channels (at 100 MHz clock)
Memory Depth per Channel258,048 vectors
Maximum Vector WidthUp to 200 bits wide (via multi-module configurations)
Compatible Logic LevelsTTL, 3-state TTL/3.3V, 3-state TTL/CMOS, ECL terminated, ECL unterminated, differential ECL (with pod)

Timing & Clocking

ParameterValue
Clock Output Delay Range11 ns in 9 steps (using clock pod)
Clock Input RangeDC to 200 MHz (using clock pod)
Internal Clock Period Range5 ns to 250 µs
Internal Clock Period SequenceProgrammable in a 1, 2, 2.5, 4, 5, 8 sequence
External Clock Frequency RangeDC to 200 MHz
External Clock Minimum High Time2 ns

Sequencing & Triggering

ParameterValue
Maximum Number of Different Macros100

Physical & Mainframe Integration

ParameterValue
Module Slot Width1 slot
Compatible MainframesHP / Agilent 16500B, 16500C, 16700-series

Power Requirements

ParameterValue
+5 V Current Draw5.5 A

Accessories

ParameterValue
Compatible Clock Pods10460A, 10463A, 10468A
Compatible Data Pods10461A, 10462A, 10464A, 10465A, 10466A, 10469A
Compatible Lead Sets10474A

Sequence Control

ParameterValue
Maximum Loop Nesting Levels4
Maximum Loop Repeat Count4096
Maximum Vector Repeat Count4096
Wait Line Inputs3

Power

ParameterValue
Data Pod Power Supply+5 V, 1 A max per pod pair

Technology

Digital Pattern Generation

Applications

Functional testing of digital designs and system stimulus