The Keysight (Agilent/HP) 5350B is a high-performance CW Microwave Frequency Counter capable of measuring signals from 10 Hz to 20 GHz. Built with integrated gallium arsenide (GaAs) microwave components, it delivers robust reliability and features exceptional sensitivity down to -40 dBm. It offers excellent throughput with measurement speeds up to 120 measurements per second over HP-IB, alongside advanced capabilities like automatic amplitude discrimination and mathematical scaling/offset. Its fast acquisition times and 1 GHz/s tracking speed make it highly suitable for testing voltage-controlled oscillators and tracking source drift.

Specifications

General

ParameterValue
InterfacesHP-IB (IEEE-488)
DisplayLiquid Crystal Display (LCD)

Physical

ParameterValue
Operating Temperature0 to 50

Input Characteristics

ParameterValue
Frequency Range10 Hz - 20 GHz
SensitivityTo -40 dBm
Automatic Amplitude DiscriminationYes (measures frequency of the highest-amplitude signal)
Acquisition Time (Automatic Mode)60 ms (fast acquisition tracking mode)
Acquisition Time (Manual Mode)20 ms
Kickback Noise (Sleep Mode)-70 dBm

Measurement and Display

ParameterValue
Tracking Speed1 GHz/s

Connectivity and Interfaces

ParameterValue
Remote Control InterfaceHP-IB (Fully Programmable)

Inputs & Outputs

ParameterValue
Microwave Input Connector (Input 2)Type-N (female)
Low Frequency Input Connector (Input 1)BNC (female)
Microwave Input Impedance50 Ω nominal
Microwave Input Damage Level+25 dBm (peak ±5 VDC)
Low Frequency Input (Input 1) CouplingAC
Timebase Output Frequency10 MHz

Measurement Characteristics

ParameterValue
Measurement Resolution1 Hz to 1 MHz (selectable)

Timebase

ParameterValue
Internal Timebase Frequency10 MHz
Standard Timebase Aging Rate< 1 x 10^-7 / month
High-Stability Timebase (Option 001) Aging Rate< 5 x 10^-10 / day

Performance

ParameterValue
Microwave Input (Input 2) FM Tolerance20 MHz p-p

Technology

Microwave Frequency Counter

Applications

Microwave frequency measurement, VCO tuning and testing, automated test system integration