The Keysight (Agilent/HP) 54751A is a dual-channel, 20 GHz electrical sampling module designed for use with the HP/Agilent 54750A and 83480A digital communications analyzer mainframes. It features user-selectable bandwidth modes (20 GHz and 12.4 GHz) to optimize the balance between high-frequency response and low noise floor.
Specifications
General
| Parameter | Value |
|---|---|
| Interfaces | Mainframe backplane connector |
| Display | None (uses mainframe display) |
Physical
| Parameter | Value |
|---|---|
| Power Supply | Powered by mainframe plug-in slot |
| Operating Temperature | 15 °C to 35 °C (specified); 10 °C to 40 °C (operating) |
| Dimensions (W×H×D) | 97 mm × 89 mm × 318 mm |
Module Overview & Compatibility
| Parameter | Value |
|---|---|
| Module Type | Electrical Sampling Module |
| Supported Mainframe Series | HP / Agilent 54750A, 83480A |
| Slot Width Requirement | 1 slot |
| Number of Input Channels | 2 |
Electrical Channel Specifications
| Parameter | Value |
|---|---|
| Electrical Bandwidth | 20 GHz (High Bandwidth Mode) / 12.4 GHz (Low Noise Mode) |
| Risetime (10% to 90%) | 17.5 ps (20 GHz Mode) / 28.2 ps (12.4 GHz Mode) |
| Vertical Sensitivity Range | 1 mV/div to 100 mV/div |
| Input Impedance | 50 Ohm |
| Input Connector Type | 3.5 mm (female) |
Signal Integrity & Noise Performance
| Parameter | Value |
|---|---|
| RMS Noise Floor (Maximum) | 1.0 mV (20 GHz Mode) / 0.5 mV (12.4 GHz Mode) |
Vertical System
| Parameter | Value |
|---|---|
| Offset Range | ±1.0 V |
| Dynamic Range | ±400 mV relative to channel offset |
| Vertical Scale Factor Range | 1 mV/div to 100 mV/div |
| Selectable Bandwidth Limits | 12.4 GHz, 20 GHz |
| Calculated Risetime (20 GHz Mode) | 17.5 ps |
| Calculated Risetime (12.4 GHz Mode) | 28.2 ps |
| RMS Noise (Typical, 12.4 GHz Mode) | 0.3 mV |
| RMS Noise (Typical, 20 GHz Mode) | 0.7 mV |
| RMS Noise (Maximum, 12.4 GHz Mode) | 0.5 mV |
| RMS Noise (Maximum, 20 GHz Mode) | 1.0 mV |
Technology
Electrical Sampling
Applications
High-speed digital signal analysis, optical transceiver testing, and TDR analysis