The Keysight (Agilent) 54754A is a high-performance 18-GHz differential TDR/TDT sampling module designed for use with Infiniium DCA, DCA-J, and legacy Agilent digitizing oscilloscope mainframes. It features two channels with built-in TDR step generators that can operate independently or in tandem for differential or common-mode stimulus-response measurements. When the TDR generators are disabled, the module functions as a high-bandwidth vertical acquisition system.

Specifications

General

ParameterValue
InterfacesInternal mainframe plug-in interface
DisplayNone (utilizes host mainframe display)
Warm-up Time1 hour
Calibration Cycle1 year

Physical

ParameterValue
Power SupplyPowered by host mainframe
Operating Temperature10 °C to 40 °C

Vertical System

ParameterValue
Channels2
Electrical Bandwidth18 GHz / 12.4 GHz (user-selectable)
Calculated Rise Time (10% to 90%)19.4 ps (at 18 GHz), 28.2 ps (at 12.4 GHz)
RMS Noise (Typical)0.25 mV (at 12.4 GHz BW), 0.5 mV (at 18 GHz BW)
RMS Noise (Maximum)0.5 mV (at 12.4 GHz BW), 1.0 mV (at 18 GHz BW)
Maximum Input Signal±2 Vdc
Nominal Input Impedance50 Ω

TDR/TDT Step Generator

ParameterValue
Number of TDR Pulser Channels2

Host Mainframe Integration

ParameterValue
Slot Occupancy1 slot

Measurement Capabilities

ParameterValue
Measurement ModesTDR (Time Domain Reflectometry), TDT (Time Domain Transmission)
Impedance MeasurementsOhms (Ω)
Edge Speed ControlUser-selectable normalized rise time filter

Inputs & Outputs

ParameterValue
Maximum Safe Input Voltage±2 V (DC + peak AC) or +16 dBm

Performance

ParameterValue
Input Dynamic Range±400 mV relative to channel offset
Offset Range±500 mV
Channel-to-Channel Isolation≥ 60 dB (DC to 12.4 GHz), ≥ 50 dB (12.4 GHz to 18 GHz)
TDR System Reflected Rise Time (10% to 90%)≤ 45 ps

TDR Performance

ParameterValue
Step Source Impedance50 Ω nominal

Technology

Time-Domain Reflectometry (TDR) & Sampling Oscilloscopy

Applications

Differential and common-mode TDR/TDT testing, high-speed digital interconnect analysis, impedance characterization, and S-parameter measurements.