The Keysight (formerly Agilent / HP) 8130A is a high-performance 300 MHz pulse generator designed for testing high-speed devices such as BiCMOS, ECL, and ECLips integrated circuits. Offering variable transition times down to 1 ns and a timing resolution of 10 ps, the 8130A is ideally suited for precise characterization of digital cells, rapid bandwidth assessment, and amplifier slew-rate measurements. Optional dual-channel capability enables simultaneous clock and data generation.

Specifications

General

ParameterValue
InterfacesGPIB (HP-IB) as standard

Timing Characteristics

ParameterValue
Frequency Range10 Hz to 300 MHz
Period Range3.33 ns to 99.9 ms
Pulse Width Range1.50 ns to 99.9 ms
Active Edge ConfigurationIndependent transition time setting for leading or trailing edges

Pulse Output Characteristics

ParameterValue
Number of Channels1 channel standard; expandable to 2 channels with Option 020
Maximum Amplitude5.00 Vpp into 50 Ω
Minimum Amplitude100 mVpp into 50 Ω
Offset Range-4.95 V to +4.95 V (into 50 Ω)
Output Voltage Window-5.00 V to +5.00 V (sum of amplitude and offset is limited within this window into 50 Ω)
Minimum Transition Time1.0 ns (measured at 10% to 90% of pulse amplitude)
Overshoot and Ringing< 5% of pulse amplitude
Source Impedance50 Ω
Output CouplingDC-coupled
Complementary OutputsStandard (Normal and Complement outputs available simultaneously on each channel)
Amplitude Limit ProtectionUser programmable upper and lower limits to protect sensitive devices under test

Trigger and Operating Modes

ParameterValue
Operating ModesContinuous (NORM), Triggered (TRIG), Gated (GATE), External Burst (E.BURST)
Double Pulse Mode SelectionAvailable on Channel 1 and Channel 2 (allows generating dual pulses within a single period)
External Input Frequency RangeDC to 300 MHz
External Input Impedance50 Ω or 10 kΩ selectable
External Trigger Minimum Pulse Width1.5 ns

Configuration Options

ParameterValue
Option 020Adds second output channel

Trigger Output

ParameterValue
Trigger Output Transition Time< 1 ns

Applications

High-speed digital design, BiCMOS/ECL/ECLips cell characterization, bandwidth assessment, and amplifier slew-rate testing