The Keysight / Agilent 83623A is a high-power synthesized swept-signal generator providing broadband frequency coverage from 10 MHz to 20 GHz. It combines the precise accuracy of a synthesized source with the versatility of a sweep oscillator. Designed for applications requiring elevated signal levels, it delivers +17 dBm maximum leveled power and low single-sideband phase noise, making it an excellent general-purpose source for component testing, receiver testing, and frequency conversion.

Specifications

General

ParameterValue
InterfacesGPIB (HP-IB)

Physical

ParameterValue
Power Supply100/120/220/240 V, 48-66 Hz (400 Hz at 115 V), 400 VA max
Operating Temperature0 to 55
Dimensions (W×H×D)425 × 178 × 648 mm
Weight27.2

Frequency Specifications

ParameterValue
Frequency Range10 MHz - 20 GHz
Frequency Resolution1 kHz (1 Hz with Option 008)

Output Power

ParameterValue
Maximum Leveled Power+17 dBm
Power Sweep Range-20 dBm to maximum power
User Flatness CorrectionSupported (for leveling at remote points)
Power Resolution0.01 dB

Spectral Purity

ParameterValue
SSB Phase Noise (10 kHz offset)-76 dBc/Hz @ 20 GHz
Harmonics<-25 dBc (2.0 to 20 GHz)
Non-Harmonic Spurious (≥ 2.0 GHz)< -50 dBc

Amplitude Modulation (AM)

ParameterValue
Scan ModulationSupported (to simulate antenna scan patterns)

Inputs and Outputs

ParameterValue
RF Output Connector3.5 mm (male)

Frequency

ParameterValue
Timebase Aging Rate< 5 × 10^-10 / day
Timebase Temperature Stability< 2 × 10^-10 / °C

Modulation

ParameterValue
Pulse Modulation On/Off Ratio> 80 dB
Pulse Modulation Rise/Fall Time< 25 ns
Minimum Pulse Width50 ns (unleveled) / 1 µs (internally leveled)
Amplitude Modulation Bandwidth (3 dB)DC to 100 kHz
Frequency Modulation BandwidthDC to 8 MHz

Sweep

ParameterValue
Sweep Time (Analog Sweep)10 ms to 100 s

Power

ParameterValue
Maximum Power Consumption400 VA

Environmental

ParameterValue
Storage Temperature-40 °C to +75 °C

Sweep Modes

ParameterValue
Step Sweep Points2 to 801

Technology

Synthesized Sweeper

Applications

Component test, receiver test, frequency conversion, antenna scan pattern simulation