The Keysight (Agilent/HP) 83731A is a synthesized signal generator operating in the 1.0 GHz to 20 GHz frequency range, widely utilized for microwave receiver testing, local oscillator substitution, and component characterization.

Specifications

Frequency

ParameterValue
Minimum Frequency1.0 GHz
Maximum Frequency20.0 GHz
Frequency Resolution1 kHz

General

ParameterValue
InterfacesGPIB (HP-IB)
DisplayLiquid Crystal Display (LCD)
Standard Programming LanguageSCPI

Physical

ParameterValue
Power Supply90 to 132 Vac / 198 to 264 Vac, 48 to 440 Hz
Dimensions (W×H×D)426 mm x 133 mm x 498 mm
Weight16 kg

Frequency Specifications

ParameterValue
Frequency Range1.0 GHz to 20 GHz
Frequency Resolution (Standard)1 kHz
External Reference Input Frequency10 MHz

Output Power Specifications

ParameterValue
Minimum Leveled Max Output Power10 dBm
Level Resolution0.01 dB
Output Impedance50 Ohm

Spectral Purity

ParameterValue
Harmonics-55 dBc
Non-Harmonic Spurious-60 dBc

Connectivity and Interfaces

ParameterValue
GPIB InterfaceHP-IB (IEEE-488.2)
RF Output ConnectorPrecision 3.5 mm male

Physical Characteristics

ParameterValue
Height133 mm
Width426 mm
Depth498 mm

Power and Environmental

ParameterValue
AC Input Voltage Range90 to 132 Vac / 198 to 264 Vac
AC Input Frequency Range48 to 440 Hz

Available Options and Accessories

ParameterValue
Option 1E1Adds 110 dB Step Attenuator
Option 1E81 Hz Frequency Resolution

Environmental

ParameterValue
Operating Temperature Range0 to +55 °C
Storage Temperature Range-40 to +75 °C
Maximum Operating Altitude4,570 m (15,000 ft)
Maximum Non-Operating Altitude15,240 m (50,000 ft)
Operating Humidity RangeUp to 95% relative humidity at 40 °C

Electrical & Power

ParameterValue
Maximum Power Consumption400 VA

Inputs & Outputs

ParameterValue
Sweep Output Voltage0 V to 10 V (nominal)

Options

ParameterValue
Option 1E5High Stability Timebase (adds ovenized crystal oscillator)

Technology

Synthesized Microwave Signal Generation

Applications

Receiver testing, radar testing, local oscillator substitution, and microwave component characterization