The Keysight (formerly Agilent/HP) 8496H is a highly reliable programmable step attenuator operating from DC to 18 GHz. It provides 0 to 110 dB of attenuation in 10 dB steps, offering excellent repeatability and an operating life exceeding 5 million cycles per section. It is designed for precision automated testing and signal level control.
Specifications
Physical
| Parameter | Value |
|---|---|
| Operating Temperature | 0 to +55 |
| Weight | 425 g (15 oz) |
General RF Specifications
| Parameter | Value |
|---|---|
| Frequency Range | DC to 18 GHz |
| Attenuation Range | 0 to 110 dB |
| Attenuation Step Size | 10 dB |
| Nominal Impedance | 50 Ω |
| Maximum RF Input Power (Average) | 1 W |
| Maximum RF Input Power (Peak) | 100 W |
RF Performance: Insertion Loss & VSWR
| Parameter | Value |
|---|---|
| Insertion Loss (0 dB state) | 0.6 dB + 0.09 dB/GHz |
| Maximum VSWR (DC to 8 GHz) | 1.5:1 |
| Maximum VSWR (8 to 12.4 GHz) | 1.6:1 |
| Maximum VSWR (12.4 to 18 GHz) | 1.9:1 |
Attenuation Accuracy & Repeatability
| Parameter | Value |
|---|---|
| Attenuation Repeatability (Typical) | 0.01 dB |
| Attenuation Repeatability (Maximum) | 0.03 dB |
Switching & Drive Specifications
| Parameter | Value |
|---|---|
| Switching Speed (Maximum) | 20 ms (including contact settling) |
| Operating Life (Minimum Cycles) | 5,000,000 cycles per section |
Physical & Mechanical Specifications
| Parameter | Value |
|---|---|
| RF Connector Options | Type-N (f), SMA (f), or APC-7 |
Options & Configurations
| Parameter | Value |
|---|---|
| Calibration Documentation Options | Option UK6 (NIST traceable data) |
Power & Control
| Parameter | Value |
|---|---|
| Drive Voltage Options | 5 Vdc (Option 011), 15 Vdc (Option 015), or 24 Vdc (Option 024) |
Configuration
| Parameter | Value |
|---|---|
| Number of Attenuator Sections | 4 |
| Attenuator Section Values | 10 dB, 20 dB, 40 dB, 40 dB |
Control & Switching
| Parameter | Value |
|---|---|
| Drive Pulse Width (Minimum) | 20 ms |
Technology
RF / Microwave
Applications
Signal Level Control / Automated Testing