The Keysight (formerly Agilent/HP) 8510C is a high-performance modular vector network analyzer designed for precision broadband measurements. Highly configurable, the 8510C system requires an external source and S-parameter test set, allowing it to measure magnitude, phase, and group delay of two-port networks from 45 MHz up to 110 GHz depending on the selected hardware. It features a color display, robust error-correction capabilities including TRL and LRM calibration, and optional time-domain transformation.
Specifications
General
| Parameter | Value |
|---|---|
| Interfaces | HP-IB (GPIB), RS-232 |
| Trigger Modes | Free run, hold, single, external |
Frequency Characteristics
| Parameter | Value |
|---|---|
| Frequency Range (Overall) | 45 MHz to 110 GHz (configuration dependent) |
| Frequency Range (2.4 mm Coax) | 45 MHz to 50 GHz |
| Frequency Range (1.0 mm Coax) | 45 MHz to 110 GHz |
Measurement Capabilities and Features
| Parameter | Value |
|---|---|
| System Architecture | Modular (Requires external source and S-parameter test set) |
| Measured Parameters | Magnitude, phase, and group delay (S-parameters of two-port networks) |
| Measurement Resolution (Magnitude) | 0.001 dB |
| Calibration Types | Thru-Reflect-Line (TRL), Line-Reflect-Match (LRM) |
| Error Correction | Real-time error-corrected measurements |
Time Domain (Optional)
| Parameter | Value |
|---|---|
| Time Domain Capability | Optional (Impulse or step waveform via inverse Fourier transform) |
Interfaces and Connectivity
| Parameter | Value |
|---|---|
| Storage Interface | Internal 3.5-inch disk drive |
Performance
| Parameter | Value |
|---|---|
| Number of Measurement Points | 51, 101, 201, 401, or 801 per trace |
| Averaging Factor | 1 to 4096 (sweep-to-sweep averaging, in powers of 2) |
| Measurement Channels | 2 independent channels |
| Nominal Impedance | 50 Ω |
Sweep & Source Control
| Parameter | Value |
|---|---|
| Sweep Modes | Ramp sweep, step sweep, single point, frequency list |
Display & Analysis
| Parameter | Value |
|---|---|
| Data Presentation Formats | Log magnitude, linear magnitude, phase, polar, Smith chart, inverted Smith chart, group delay, SWR, real, imaginary |
| Trace Math | Vector division or subtraction of current data and memory (Data/Memory, Data-Memory) |
Measurement Features
| Parameter | Value |
|---|---|
| Markers | 5 independent markers per channel plus 1 reference marker |
| Limit Testing | Arbitrary limit lines with pass/fail testing |
| Electrical Delay / Phase Offset | Adjustable electrical delay and phase offset for measurement plane extension |
Calibration & Error Correction
| Parameter | Value |
|---|---|
| Calibration Kits | Pre-defined models for standard kits and fully user-definable custom standards |
Storage
| Parameter | Value |
|---|---|
| Internal Mass Storage | 3.5-inch floppy disk drive (DOS formatted) |
Technology
Vector Network Analysis
Applications
High-frequency component characterization, on-wafer probing, in-fixture testing, broadband two-port network analysis