The Keysight (Agilent) 86100C Infiniium DCA-J is a wide-bandwidth digital communications analyzer and sampling oscilloscope mainframe. When configured with up to two plug-in modules, it provides bandwidths in excess of 80 GHz, delivering precise waveform measurements, automated eye diagram analysis, high-precision TDR/TDT for impedance characterization, and industry-leading jitter analysis. It is designed for optical and electrical transmitter compliance testing and high-speed digital analysis.

Specifications

General

ParameterValue
Display10.4-inch color TFT LCD with touch screen

Physical

ParameterValue
Power Supply115/230 VAC, 48-66 Hz, 540 W Max
Operating Temperature10 °C to 40 °C

Mainframe Characteristics

ParameterValue
Module Slots2 (accepts 86100 series plug-in modules)
Operating SystemWindows XP Professional
Display Size10.4 in
User InterfaceTouch screen, front panel knobs/buttons, external mouse and keyboard supported
Active Probing CompatibilitySupports InfiniiMax probes via N1022A probe adapter

Vertical System (Electrical/Optical)

ParameterValue
Vertical Resolution14-bit A/D converter
Maximum Input Power / VoltageModule dependent

Trigger System

ParameterValue
Pattern LockSupported (enables single-valued waveform viewing at highest bit rates)

Eye / Pattern Mode Measurements

ParameterValue
Extinction RatioSupported (module dependent)
Eye HeightSupported
Eye WidthSupported
Crossing PercentageSupported
Q-FactorSupported
Jitter (Peak-to-Peak)Supported
Jitter (RMS)Supported
Signal-to-Noise Ratio (SNR)Supported
Waveform EqualizationSupported (on-board algorithms for capturing closed eyes)

Advanced Jitter Analysis (Option)

ParameterValue
Total Jitter (TJ)Supported (with Option 200 Advanced Jitter Analysis)
Random Jitter (RJ)Supported (with Option 200 Advanced Jitter Analysis)
Deterministic Jitter (DJ)Supported (with Option 200 Advanced Jitter Analysis)
Data Dependent Jitter (DDJ)Supported (with Option 200 Advanced Jitter Analysis)
Duty Cycle Distortion (DCD)Supported (with Option 200 Advanced Jitter Analysis)
Periodic Jitter (PJ)Supported (with Option 200 Advanced Jitter Analysis)
Sub-Rate Jitter (SRJ)Supported (with Option 200 Advanced Jitter Analysis)
Inter-Symbol Interference (ISI)Supported (with Option 200 Advanced Jitter Analysis)

TDR / TDT Mode (Time Domain Reflectometry)

ParameterValue
Impedance Measurement RangeSupported (with TDR module)

Input / Output Interfaces

ParameterValue
GPIB (IEEE-488)Standard
LAN Configuration10/100Base-T Ethernet
USB Ports (Host/Device)USB 2.0 Standard
External Video Monitor OutputVGA
Serial Port (RS-232)Standard

Environmental

ParameterValue
Storage Temperature-40 °C to 70 °C
Operating AltitudeUp to 4,600 m (15,000 ft)

Performance

ParameterValue
Record Length16 to 16,384 points per waveform

Options

ParameterValue
Option 200Enhanced Jitter Analysis
Option 202Enhanced Impedance and S-Parameter Analysis
Option 300Advanced Amplitude Analysis
Option 090Removable Hard Drive
Option 201Advanced Waveform Analysis Software
Option 400PLL and Jitter Spectrum Measurement Software

Technology

Digital Sampling Oscilloscope / Digital Communications Analyzer

Applications

Transmitter compliance testing, high-speed digital design, optical network test, TDR/TDT impedance analysis, advanced jitter analysis