The Keysight (formerly Agilent / HP) 8673E is a synthesized signal generator designed for RF and microwave testing. Operating over a frequency range of 2.0 to 18.0 GHz, it provides AM, FM, and pulse modulation capabilities along with precise digital sweep functions, making it a reliable instrument for complex signal generation tasks.

Specifications

Frequency

ParameterValue
Minimum Frequency2.0 GHz
Maximum Frequency18.0 GHz
Frequency Resolution1 kHz
Frequency Bands2.0-6.6 GHz / 6.6-12.3 GHz / 12.3-18.0 GHz

Output

ParameterValue
Maximum Output Power8 dBm
Output Power Range-120 to +8 dBm

Modulation

ParameterValue
ModulationAM, FM, Pulse
Sweep ModesAuto, Manual, Single
Pulse Modulation Rise/Fall Time< 50 ns
Pulse Modulation On/Off Ratio> 80 dB
FM Peak DeviationUp to 10 MHz
AM Maximum Depth75%
AM Modulation Rate50 Hz to 10 kHz
Internal Modulation Frequencies400 Hz and 1 kHz (selectable)

General

ParameterValue
InterfacesHP-IB (GPIB)

Physical

ParameterValue
Power Supply100 / 120 / 220 / 240 V AC (+11%, -10%), 48 to 66 Hz, 400 VA max
Dimensions (W×H×D)425 mm × 133 mm × 520 mm
Weight24 kg

Frequency Specifications

ParameterValue
Frequency Range2.0 GHz to 18.0 GHz
External Reference Input Frequency10 MHz

Amplitude Specifications

ParameterValue
Minimum Output Power-120 dBm
Amplitude Resolution0.1 dB
Output Impedance50 Ohm

Spectral Purity

ParameterValue
Harmonics-40 dBc
Non-Harmonics (Spurious)-60 dBc

Sweep and Operating Modes

ParameterValue
Digital Sweep CapabilityYes

System Connectivity and Interfaces

ParameterValue
RF Output Connector TypeType-N

Environmental

ParameterValue
Operating Temperature0 to 55 °C
Storage Temperature-55 to +75 °C
Operating AltitudeUp to 4600 m

RF Output

ParameterValue
Output Flatness±1.2 dB (leveled)

Power Requirements

ParameterValue
Power Consumption400 VA (maximum)
Line Frequency48 to 66 Hz

Interfaces

ParameterValue
HP-IB Interface FunctionsSH1, AH1, T6, L4, SR1, RL1, PP0, DC1, DT1, C0, E1

Technology

Synthesized Signal Generation

Applications

RF & Microwave Signal Testing