The Keysight (Agilent/HP) E1411B is a C-size, 1-slot, register-based VXI 5.5-digit multimeter. It is identical in electrical design to the B-size E1326B but designed for standard C-size mainframes. It features a low-noise 5.5-digit integrating A/D converter for high-accuracy measurements, alongside a 14-bit sampling A/D converter supporting reading rates up to 13 kHz. This makes the E1411B highly versatile for both precision laboratory-grade measurements and high-speed data acquisition applications. This autoranging multimeter supports Vdc, Vac, 2-wire and 4-wire resistance, and direct temperature measurements.
Specifications
General
| Parameter | Value |
|---|---|
| Interfaces | VXIbus (Register-Based, C-size, P1/P2 Connectors) |
Physical
| Parameter | Value |
|---|---|
| Power Supply | Powered by VXIbus mainframe backplane (+5 V, +12 V, -12 V, -5.2 V, -2 V) |
| Operating Temperature | 0 to 55 °C |
| Dimensions (W×H×D) | 30.5 mm x 262 mm x 340 mm |
DC Voltage
| Parameter | Value |
|---|---|
| DC Voltage Ranges | 125 mV, 1 V, 8 V, 64 V, 300 V |
| DC Voltage Maximum Resolution | 1 µV |
| DC Input Resistance (125 mV to 8 V ranges) | > 10 GΩ |
| DC Input Resistance (64 V and 300 V ranges) | 10 MΩ ± 1% |
| DC Voltage Maximum Input (HI to LO) | 300 VDC |
| Normal Mode Rejection Ratio (NMRR) | > 60 dB at 50/60 Hz |
| Common Mode Rejection Ratio (CMRR) | > 120 dB at DC |
Resistance
| Parameter | Value |
|---|---|
| Resistance Ranges | 256 Ω, 2048 Ω, 16.384 kΩ, 131.072 kΩ, 1.048576 MΩ, 8.388608 MΩ |
| Resistance Measurement Modes | 2-wire and 4-wire |
| Offset Compensation | Selectable on 256 Ω, 2048 Ω, and 16.384 kΩ ranges |
| Resistance Maximum Resolution | 1 mΩ |
Temperature
| Parameter | Value |
|---|---|
| Supported Temperature Sensors | Thermocouples, Thermistors, RTDs |
| Supported Thermocouple Types | E, J, K, N, R, S, T |
| Supported Thermistor Types | 2.2 kΩ, 5 kΩ, 10 kΩ |
| Supported RTD Types | 100 Ω Platinum (alpha = 0.00385 or 0.003916) |
Measurement Speed & Digitizing
| Parameter | Value |
|---|---|
| A/D Converter Types | Integrating A/D (low noise) and Sampling A/D (high speed) |
| Integrating A/D Resolution | 5.5 digits |
| Sampling A/D Resolution | 14-bit |
| Maximum Sampling A/D Reading Rate | 13 kHz (13,000 readings/s) |
| Integrating A/D Reading Rate (5.5 digits, 1 PLC @ 60 Hz) | 60 readings/s |
| Integrating A/D Reading Rate (4.5 digits, 0.15 PLC @ 60 Hz) | 360 readings/s |
| Integrating A/D Reading Rate (5.5 digits, 1 PLC @ 50 Hz) | 50 readings/s |
| Integrating A/D Reading Rate (4.5 digits, 0.15 PLC @ 50 Hz) | 300 readings/s |
Triggering & Synchronization
| Parameter | Value |
|---|---|
| Trigger Sources | Immediate, External, VXI Backplane (TTLTRG0-7), Software, Timer |
| Timer Pacer Range | 10 µs to 65.535 s |
| Timer Pacer Resolution | 10 µs |
System & Bus Interface
| Parameter | Value |
|---|---|
| VXIbus Module Size | C-size |
| Slot Width Requirements | 1 slot |
| VXIbus Device Type | Register-based |
| Programming Protocol | SCPI (via Command Module like E1406A) or direct register programming |
| Software Drivers | VXIplug&play drivers, SCPI instrument driver |
Environmental & Physical
| Parameter | Value |
|---|---|
| Storage Temperature Range | -40 °C to 75 °C |
| Relative Humidity Range | Up to 95% RH (non-condensing, 0 °C to 40 °C) |
| Calibration Type | Software calibration (no manual internal adjustments) |
Isolation
| Parameter | Value |
|---|---|
| Maximum LO to Guard Voltage | 200 V |
| Maximum Guard to Chassis Voltage | 350 V |
Performance
| Parameter | Value |
|---|---|
| Current Measurement Support | No current measurement capability |
A/D Conversion
| Parameter | Value |
|---|---|
| A/D Integration Times | 1 PLC, 0.15 PLC, 0.02 PLC |
VXI Interface
| Parameter | Value |
|---|---|
| VXI Logical Address Range | 0 to 255 (switch selectable) |
Triggering
| Parameter | Value |
|---|---|
| External Trigger Input Level | TTL (negative-edge sensitive) |
| Voltmeter Complete Output | TTL negative pulse |
Technology
VXIbus Register-Based Multimeter
Applications
Data Acquisition, Automated Test Systems (ATE), Computer-Aided Testing (CAT)