The Teledyne LeCroy SDA 760Zi is a high-performance 6 GHz, 4-channel digital oscilloscope and serial data analyzer from the SDA 7 Zi series. Engineered for advanced serial data compliance testing and jitter analysis, it features the proprietary X-Stream II streaming architecture for exceptionally fast processing. The analyzer includes an integrated high-speed 2.7 Gb/s serial pattern trigger and features a unique Quad Summary View that simultaneously presents an eye diagram, time interval error (TIE), bathtub curve, and jitter histogram on its spacious 15.3-inch touch screen.

Specifications

General

ParameterValue
InterfacesUSB Host, USB Device, LAN (LXI compliant), GPIB (optional), External Video (DVI-D & VGA), Audio In/Out
Display15.3-inch widescreen color touch screen (1280 x 768 WXGA)
Calibration Interval1 year

Physical

ParameterValue
Power Supply100 - 240 VAC (±10%) at 50/60 Hz (±5%), or 100 - 120 VAC at 400 Hz; Max Power Consumption 650 W (up to 800 W with options)
Operating Temperature5 °C to 40 °C
Dimensions (W×H×D)467 mm x 355 mm x 312 mm
Weight18.4 kg

Key Acquisition Specifications

ParameterValue
Analog Bandwidth (-3 dB)6 GHz
Rise Time (10% to 90%, typical)75 ps
Rise Time (20% to 80%, typical)55 ps
Input Channels4
Max Real-Time Sample Rate (Single-Channel)40 GS/s (on 2 channels)
Max Real-Time Sample Rate (Multi-Channel)20 GS/s (on 4 channels)
Max Memory Depthup to 256 Mpts/ch (configuration dependent)
Vertical Resolution (Standard)8-bit
Vertical Resolution (Enhanced Resolution Mode)Up to 11-bit

Vertical System

ParameterValue
Input Impedance50 Ω or 1 MΩ
Input Coupling50 Ω: DC; 1 MΩ: AC, DC, GND
Maximum Input Voltage5 Vrms (50 Ω); 100 V max (1 MΩ)
Vertical Sensitivity Range (50 Ohm)2 mV/div - 1 V/div
Vertical Sensitivity Range (1 MOhm)2 mV/div - 10 V/div
DC Gain Accuracy±1.5% of full scale
Offset Range50 Ω: ±1 V (2 mV to 19.4 mV/div), ±4 V (19.6 mV to 102 mV/div), ±10 V (104 mV to 1 V/div)
Probe Interfaces SupportedProLink and ProBus
Bandwidth Limiters20 MHz, 200 MHz, 1 GHz, 3 GHz, 4 GHz
Channel-to-Channel Isolation50 Ω: > 43 dB (150:1) to 1 GHz, > 38 dB (80:1) to 1.5 GHz, > 34 dB (50:1) to 3 GHz, > 30 dB (30:1) to 6 GHz

Horizontal System & Timebase

ParameterValue
Timebase Accuracy±1 ppm
Channel-to-Channel Deskew Range±9 μs

Trigger System

ParameterValue
Trigger ModesAuto, Normal, Single, Stop
Trigger CouplingAC, DC, LF Rej, HF Rej
Standard Trigger TypesEdge, Glitch, Width, Logic, Slewrates, Interval, Dropout, Runt, TV-Video
High-Speed Serial Pattern Trigger SpeedUp to 2.7 Gb/s
High-Speed Serial Pattern Trigger LengthUp to 80-bit patterns

Serial Data Analysis & Jitter Software

ParameterValue
Eye Diagram AnalysisSDA Quad Summary View showing Eye, TIE, Bathtub, and Jitter Histogram simultaneously
Eye Diagram FeatureFastest eye building using X-Stream II architecture
Jitter Decomposition ModelDual-Path Spectral and N-Rz
Total Jitter (Tj) ParametersSupported
Random Jitter (Rj) ParametersSupported
Deterministic Jitter (Dj) ParametersSupported
Data-Dependent Jitter (DDj) ParametersSupported
Periodic Jitter (Pj) ParametersSupported
Inter-Symbol Interference (ISI) PlotsSupported
Supported Serial Standards MasksEthernet, USB 2.0, HDMI 1.2, PCI Express (2.5 GT/s), Serial ATA (1.5 Gb/s), UWB
Cable De-Embedding FeaturePermits SDA tools to be used as if the cables were not in the system
8b/10b DecodingSupported
Spread Spectrum Clock SupportSupported
Mask Violation LocatorSupported

Acquisition Modes

ParameterValue
Real-Time Acquisition ModeSupported
Sequence Mode (Segmented Memory)Supported
Roll ModeSupported
Average ModeSupported
Envelope ModeSupported
WaveStream Fast Viewing ModeSupported

Measurement, Math & Waveform Analysis

ParameterValue
Advanced Math OperatorsFFT, Calculus (Derivative, Integral), Histograms, Trend, Track
Custom Math CapabilitiesMATLAB, C/C++, Excel integration

Display & User Interface

ParameterValue
Display Size15.3 in (39 cm) diagonal
Display ResolutionWXGA (1280 x 768) pixels
Display TypeColor Widescreen Touch Screen
Multi-Grid ManagementSupported (up to 8 grids)

Processor & System Hardware

ParameterValue
CPUIntel Core 2 Quad (2.5 GHz or higher)
System Memory (RAM)4 GB standard (up to 8 GB)
Storage Drive TypeSolid State Drive (SSD) or Hard Disk Drive (HDD)
Operating SystemWindows 7 Professional (64-bit)

Connectivity & Interface Ports

ParameterValue
LAN Interface10/100/1000Base-T (LXI Class C compliant)
USB Ports6 x USB 2.0 (Host), 1 x USB 2.0 (Device)
GPIB InterfaceOptional (via external card or adapter)
External Video Output PortDVI-D and VGA
Reference Clock Input10 MHz (BNC)
Reference Clock Output10 MHz (BNC)
Auxiliary OutputTrigger Out, Calibrator Out
External Trigger InputBNC

Environmental & Compliance

ParameterValue
Storage Temperature Range-20 °C to 60 °C
Operating Humidity Range5% to 80% RH (non-condensing)
Operating Altitude Limit3,000 m (10,000 ft)

Acquisition System

ParameterValue
Waveform InterpolationLinear, Sin(x)/x
Standard Memory Depth32 Mpts/ch (4 channels), 64 Mpts/ch (2 channels)

Math & Analysis

ParameterValue
Maximum Zoom Traces8
Maximum Math Traces8

Triggering

ParameterValue
Trigger Jitter< 2.5 ps rms (typical)
External Trigger Input Impedance50 Ohm / 1 MOhm (selectable)

Horizontal System

ParameterValue
Sample Clock Jitter< 125 fs rms (typical, internal reference)

Power

ParameterValue
Power Consumption975 VA (typical)

Interfaces

ParameterValue
LXI ComplianceLXI Class C compliant

Inputs & Outputs

ParameterValue
Input ConnectorsProLink (50 Ohm only) and ProBus (1 MOhm / 50 Ohm)

Clock / Timebase

ParameterValue
Jitter Noise Floor120 fs rms (typical)

Interfaces & Connectivity

ParameterValue
LSIB SupportSupported via optional LeCroy Serial Interface Bus card (up to 325 MB/s)

Environmental

ParameterValue
Operating Vibration0.31 g rms (5 Hz to 500 Hz), 15 minutes in each of three orthogonal axes
Non-Operating Vibration2.4 g rms (5 Hz to 500 Hz), 15 minutes in each of three orthogonal axes
Operating Shock30 g peak, half-sine, 11 ms pulse, 3 shocks in each direction along 3 mutually perpendicular axes

Technology

Digital Real-Time Oscilloscope

Applications

High-speed Serial Data Analysis & Compliance Testing