The Noisecom UFX-BER series consists of precision Eb/No (Energy per bit to Noise power spectral density ratio) generators. These highly automated instruments provide accurate, repeatable control of carrier-to-noise (C/N), C/No, and C/I ratios, making them essential for bit error rate (BER) testing in satellite, wireless, and military communications.

Specifications

General

ParameterValue
InterfacesGPIB (IEEE-488.2), RS-232
DisplayFront panel LCD

Physical

ParameterValue
Power Supply115 VAC (60 Hz) or 230 VAC (50 Hz), switchable
Operating Temperature0°C to 50°C
Dimensions (W×H×D)438 mm x 133 mm x 330 mm

RF & Noise Performance

ParameterValue
Eb/No Range-10 to +40 dB
C/N Range-10 to +40 dB
Eb/No Accuracy±0.2 dB RSS
Impedance50 Ohms (nominal)
Operating ModesEb/No, C/N, C/No, C/I, Noise Only, Carrier Only
Signal Path Gain0 dB nominal

Input & Output Interfaces

ParameterValue
RF Output Connector (below 1 GHz)BNC female
RF Output Connector (above 1 GHz)SMA female

Options & Accessories

ParameterValue
UFX-BER-70 Frequency Range50 to 90 MHz
UFX-BER-140 Frequency Range100 to 180 MHz
UFX-BER-L Frequency Range950 to 1450 MHz

Physical & Mechanical

ParameterValue
Form FactorBenchtop or 19-inch rackmount
Rack Height3U

Performance

ParameterValue
Eb/No Resolution0.015 dB
Carrier Input Level Range-30 dBm to 0 dBm (standard)
Bit Rate Entry Range1 bps to 999.999 Mbps

Environmental

ParameterValue
Storage Temperature-40°C to +85°C
Operating HumidityUp to 95% RH (non-condensing)

Noise Performance

ParameterValue
Noise TypeAdditive White Gaussian Noise (AWGN)
Crest Factor5:1 (14 dB) minimum

Technology

Eb/No Carrier-to-Noise Generation

Applications

BER Testing, Satellite Communication Testing, Receiver Sensitivity Testing

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