The Stanford Research Systems CG635 is a synthesized clock generator capable of producing extremely low-jitter clock signals across a broad frequency range from 1 µHz to 2.05 GHz. With sub-picosecond jitter performance, flexible output levels, and highly stable optional internal timebases, it is a premier reference source for telecom, semiconductor testing, and precision timing applications.

Specifications

General

ParameterValue
InterfacesGPIB, RS-232
Display16-character alphanumeric LED display

Physical

ParameterValue
Power Supply90 to 264 VAC, 47 to 63 Hz, <50 W
Operating Temperature0 °C to 40 °C
Dimensions (W×H×D)216 mm × 89 mm × 330 mm
Weight4.1 kg

Frequency Characteristics

ParameterValue
Frequency Range (Q & -Q)1 µHz to 2.05 GHz
Frequency Range (CMOS)1 µHz to 250 MHz
Frequency Resolution1 µHz
Standard Timebase Stability±5 ppm (0 °C to 40 °C)
Standard Timebase Aging<5 ppm/year

Q & -Q Outputs

ParameterValue
Q & -Q Output Logic LevelsPECL, LVPECL, ECL, LVDS, +7 dBm RF, or Custom (Variable)
Q & -Q Rise/Fall Time<100 ps (20% to 80%)
Q & -Q RMS Jitter<1 ps rms (any frequency), typically <250 fs rms above 100 MHz
Q & -Q Random Jitter<80 fs rms (typical at 622.08 MHz, 12 kHz to 20 MHz band)
Q & -Q Output Connector TypeSMA (female)

Custom Q & -Q Levels

ParameterValue
Custom Q & -Q Amplitude Range0.2 V to 1.0 V into 50 Ω
Custom Q & -Q Offset Range-2.00 V to +3.00 V
Custom Q & -Q Resolution10 mV

CMOS Output

ParameterValue
CMOS Amplitude Range0.25 V to 3.0 V into 50 Ω (0.5 V to 6.0 V into high impedance)
CMOS Rise/Fall Time<1 ns (typically 300 ps, 20% to 80%)
CMOS Output Impedance50 Ω
CMOS Output ConnectorBNC (female)

Phase Control

ParameterValue
Phase Range-360.00° to +360.00°
Phase Resolution0.01°
Phase Delay Range-100 ns to +100 ns
Phase Delay Resolution1 ps

Timebase Options

ParameterValue
Option 01 OCXO Temperature Stability0.005 ppm (0 °C to 40 °C)
Option 01 OCXO Aging Rate<0.2 ppm/year
Option 02 Rubidium Temperature Stability0.0001 ppm (0 °C to 40 °C)
Option 02 Rubidium Aging Rate<0.05 ppb/month (<0.5 ppb/year)

Reference Clock Input/Output

ParameterValue
External Reference Input Frequency10 MHz (accepts ±10 ppm)
External Reference Input Level0.1 Vpp to 5 Vpp
External Reference Input Impedance50 Ω
Reference Output Frequency10 MHz
Reference Output Level1.0 Vpp into 50 Ω

Spectral Purity

ParameterValue
Spurious Noise (Non-Harmonic)<-70 dBc
Harmonics<-40 dBc

Expansion & Options

ParameterValue
Rear Panel Expansion SlotsTwo slots for optional CG640–CG649 series output translators

Performance

ParameterValue
SSB Phase Noise (10 MHz, 100 Hz offset)-130 dBc/Hz (typical)
SSB Phase Noise (10 MHz, 10 kHz offset)-143 dBc/Hz (typical)
SSB Phase Noise (100 MHz, 100 Hz offset)-110 dBc/Hz (typical)
SSB Phase Noise (100 MHz, 10 kHz offset)-135 dBc/Hz (typical)
SSB Phase Noise (622.08 MHz, 100 Hz offset)-95 dBc/Hz (typical)
SSB Phase Noise (622.08 MHz, 10 kHz offset)-118 dBc/Hz (typical)
SSB Phase Noise (2.025 GHz, 100 Hz offset)-85 dBc/Hz (typical)
SSB Phase Noise (2.025 GHz, 10 kHz offset)-108 dBc/Hz (typical)
Sub-harmonicsNone (≤ 1.025 GHz), <-40 dBc (> 1.025 GHz)

Outputs

ParameterValue
Q & -Q Output Impedance50 Ω
Reference Output Impedance50 Ω

Features

ParameterValue
PRBS Generator (Option 03)PRBS7, PRBS10, PRBS15, PRBS23, PRBS31
Instrument State Storage9 setup locations

Option 04 Rear-Panel CMOS Outputs

ParameterValue
Option 04 Output Channels4
Option 04 Frequency Range1 µHz to 250 MHz
Option 04 Amplitude Range (Hi-Z)0.5 V to 4.0 V
Option 04 Amplitude Range (50 Ω)0.25 V to 2.0 V
Option 04 Amplitude Resolution10 mV
Option 04 Rise/Fall Time< 1.5 ns
Option 04 Source Impedance50 Ω
Option 04 Connector TypeBNC

Option 03 PRBS Generator

ParameterValue
PRBS Polynomial Patterns2^7-1, 2^10-1, 2^15-1, 2^23-1, 2^31-1
PRBS Data FormatNRZ

Clock Outputs (Q & -Q)

ParameterValue
LVDS Differential Swing350 mV
LVDS Common-Mode Voltage1.25 V
CML Output Swing400 mV (0 V to -0.4 V)

Reference Input

ParameterValue
External Reference Lock Range±10 ppm

Technology

Synthesized Clock Generator

Applications

Precision Timing, Telecom Clocking, Phase Noise Measurement, Semiconductor Testing

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