The Stanford Research Systems DG535 is a digital delay and pulse generator providing four precisely-timed logic transitions or two independent pulse outputs. It features a 5 ps delay resolution, very low jitter, and a wide delay range of up to 1000 seconds, making it an industry standard for laser timing systems, automated testing, and precision pulse applications.

Specifications

General

ParameterValue
InterfacesGPIB
Display20-character backlit LCD
Instrument Setup Memory9 non-volatile instrument setups

Physical

ParameterValue
Power Supply100, 120, 220, or 240 VAC, 50/60 Hz, 70 W
Operating Temperature0 to +50
Dimensions (W×H×D)356 × 89 × 356
Weight4.5

Delays

ParameterValue
Number of Delay Channels4 (A, B, C, D)
Delay Range0 to 1000 s
Delay Resolution5 ps
Insertion Delay~85 ns (external trigger to T0)
Delay LinkingChannels can be linked to T0 or any other delay channel

Internal Rate Generator

ParameterValue
Trigger Rate Range1 mHz to 1 MHz
Rate Resolution4 digits
Triggering ModesInternal, External, Single-shot, Burst, AC Line

Front Panel Outputs

ParameterValue
Available Output TypesTTL, ECL, NIM, Variable
Variable Amplitude Range-3 V to +4 V
Amplitude Resolution10 mV
Maximum Output Transition4 V
Output Impedance Limits50 Ω or High-Z termination

Timebase and Reference

ParameterValue
Standard Oscillator TypeCrystal oscillator
Standard Oscillator Stability25 ppm
Optional Oscillator TypeTCXO (Temperature Compensated Crystal Oscillator)
Optional Oscillator Stability1 ppm

Triggering

ParameterValue
External Trigger Threshold±2.56 V (10 mV resolution)
External Trigger SlopePositive or negative

Performance

ParameterValue
Trigger to T0 Jitter2.5 ns rms

Timebase

ParameterValue
Internal Timebase Frequency10.0 MHz
External Timebase Input10.0 MHz (typical 1 Vpp)

Outputs

ParameterValue
Front Panel OutputsT0, A, B, C, D, AB, -AB, CD, -CD
TTL Output Level0 to 4 VDC (nominal into 50 Ω or high impedance)
ECL Output Level-1.8 to -0.8 VDC (into 50 Ω)
NIM Output Level-0.8 to 0 VDC (into 50 Ω)

Technology

Digital Delay Generation

Applications

Laser timing, automated testing, precision pulse applications