The Stanford Research Systems DS335 is a 3.1 MHz synthesized function generator that utilizes direct digital synthesis (DDS) to provide high-resolution, phase-continuous waveforms. It generates sine, square, triangle, and ramp waves, alongside a 10 MHz white noise source, with a frequency resolution of 1 µHz. The DS335 also includes linear and logarithmic frequency sweeps, binary FSK modulation, and optional GPIB and RS-232 digital interfaces for computer control.

Specifications

General

ParameterValue
InterfacesGPIB and RS-232 (with Option 01)
Display12-digit green LED
Setup Storage9 instrument configurations

Physical

ParameterValue
Power Supply100/120/220/240 VAC, 50/60 Hz, 22 W
Operating Temperature0°C to 50°C
Dimensions (W×H×D)216 mm × 89 mm × 330 mm
Weight3.6 kg

Waveform Characteristics

ParameterValue
Standard WaveformsSine, Square, Triangle, Ramp, Noise

Frequency Specifications

ParameterValue
Sine Frequency Range1 µHz to 3.1 MHz
Square Frequency Range1 µHz to 3.1 MHz
Triangle Frequency Range1 µHz to 10 kHz
Ramp Frequency Range1 µHz to 10 kHz
Noise Bandwidth10 MHz
Frequency Resolution1 µHz
Frequency Accuracy±5 ppm (0°C to 50°C)
Aging Rate< 5 ppm/year

Amplitude & Output Characteristics

ParameterValue
Amplitude Range (50 Ω)50 mVpp to 10 Vpp
Amplitude Range (Open Circuit)100 mVpp to 20 Vpp
Amplitude Resolution3 digits
Amplitude Accuracy (at 1 kHz)±0.1 dB (1.15%) of setting for amplitudes > 0.1 Vpp
Sine Flatness (100 Hz to 1 MHz)±0.15 dB
Sine Flatness (1 MHz to 3.1 MHz)±0.3 dB
Output Impedance50 Ω
DC Offset Range (50 Ω)±5 VDC
DC Offset Range (Open Circuit)±10 VDC
Output ProtectionShort-circuit protected

Sine Wave Distortion & Purity

ParameterValue
Harmonic Distortion (DC to 20 kHz)<-55 dBc
Harmonic Distortion (20 kHz to 100 kHz)<-50 dBc
Harmonic Distortion (100 kHz to 1 MHz)<-40 dBc
Harmonic Distortion (1 MHz to 3.1 MHz)<-35 dBc
Spurious Noise (<100 kHz)<-55 dBc (DC to 1 MHz)
Phase Noise<-50 dBc in a 30 kHz band centered on the carrier

Square Wave Characteristics

ParameterValue
Square Wave Rise/Fall Time<15 ns (10% to 90% at full output)
Square Wave Overshoot<5% (at full output)
Square Wave Symmetry50% ± 1%

Ramp Characteristics

ParameterValue
Ramp Symmetry Range0% to 100%
Ramp Symmetry Resolution1%
Ramp Linearity<0.1% of full scale

Noise Characteristics

ParameterValue
Noise TypePseudo-random White Noise
Noise Flatness (DC to 100 kHz)<±1.0 dB
Noise Flatness (100 kHz to 1 MHz)<±2.0 dB
Noise Flatness (1 MHz to 10 MHz)<±3.0 dB

Sweep & Modulation

ParameterValue
Sweep TypeLinear or Logarithmic
Sweep Rate0.01 Hz to 1 kHz
Sweep Time Range1 ms to 100 s
Sweep Span1 µHz to 3.1 MHz
Sweep PhasePhase continuous
Modulation TypeBinary FSK (Frequency Shift Keying)
FSK Rate (Internal)0.01 Hz to 50 kHz
FSK Rate (External)DC to 1 MHz (TTL input)

Inputs & Outputs

ParameterValue
Main Output ConnectorFront-panel BNC
Sync OutputFront-panel BNC, TTL level
Trigger InputRear-panel BNC, TTL level
FSK InputRear-panel BNC, TTL level
External Clock Input Frequency10 MHz
Clock Output Frequency10 MHz
Clock Output LevelTTL (into 50 Ω)
FSK/Trig Input Impedance>10 kΩ

Clock & Synchronization

ParameterValue
External Clock InputRear-panel BNC, 10 MHz, -2 dBm to +15 dBm
Clock OutputRear-panel BNC, 10 MHz, TTL level into 50 Ω

Physical & Environmental

ParameterValue
Operating Humidity RangeUp to 95% non-condensing

Connectivity

ParameterValue
Standard Interfaces OptionOption 01 adds GPIB (IEEE-488) and RS-232

Timebase

ParameterValue
Standard Timebase Stability±5 ppm (0 °C to 50 °C)
Option 01 TCXO Frequency Stability±1 ppm (0 °C to 50 °C)
Option 01 TCXO Aging Rate±1 ppm/year
Standard Timebase Frequency10 MHz

Phase

ParameterValue
Phase Range-360° to +360°
Phase Resolution0.001°

Sine Wave Performance

ParameterValue
Spurious Components (DC to 1 MHz)<-50 dBc
Spurious Components (1 MHz to 3.1 MHz)<-40 dBc

DC Offset

ParameterValue
DC Offset Resolution3 digits

Power

ParameterValue
Power Consumption35 W

Auxiliary Inputs & Outputs

ParameterValue
Sync Output LevelTTL

Technology

Direct Digital Synthesis (DDS)

Applications

Electronic testing, signal modulation, and waveform generation