The Stanford Research Systems SR760 is a single-channel FFT spectrum analyzer with a frequency range extending from 476 µHz to 100 kHz and a 90 dB dynamic range. It features a 100 kHz real-time bandwidth, a 3.5-inch MS-DOS compatible floppy disk drive, and comprehensive remote interfaces including GPIB and RS-232. Built for demanding noise, vibration, and electronic measurements, the SR760 provides outstanding performance, high resolution, and extensive analysis capability.

Specifications

General

ParameterValue
InterfacesGPIB (IEEE-488.2), RS-232, Parallel Printer Port
Display7-inch monochrome CRT (400H x 250V graphics)

Physical

ParameterValue
Power Supply100/120/220/240 VAC, 50/60 Hz, 60 W
Operating Temperature0 °C to 50 °C
Dimensions (W×H×D)432 mm × 159 mm × 470 mm
Weight16.3

Frequency

ParameterValue
Frequency Range476 µHz to 100 kHz
Frequency Spans191 mHz to 100 kHz in a 1-2-5 sequence
Real-Time Bandwidth100 kHz
FFT Resolution400 lines
Frequency Accuracy±25 ppm (0 °C to 50 °C)
Number of Frequency Spans20
Frequency Temperature Stability<5 ppm/°C
Frequency Clock Aging<5 ppm/year

Signal Input

ParameterValue
Number of Input Channels1
Input CouplingAC or DC
Input ConfigurationSingle-ended or differential
Input Impedance1 MΩ, 15 pF
AC Coupling Cutoff Frequency1 Hz (-3 dB)
Common Mode Rejection Ratio90 dB @ 1 kHz (for input range < -6 dBV)
Maximum Input Safety Voltage57 Vp continuous (100 Vp momentary)
Input Noise Floor-160 dBVrms/√Hz typical (>1 kHz)

Amplitude & Dynamic Range

ParameterValue
Full-Scale Input Range-60 dBV (1 mVp) to +34 dBV (50 Vp) in 2 dB steps
Dynamic Range90 dB typical (spurious free)
Intermodulation Distortion< -90 dB (two tones within span, each -6 dB from full scale)
Spurious Responses< -90 dB full scale (with source or input shielded)
Aliasing Responses< -90 dB full scale
Absolute Amplitude Accuracy±0.2 dB (excluding window effects)

Measurement & Processing

ParameterValue
Window FunctionsBlackman-Harris, Hanning, Flat-Top, Uniform
Measurement ModesSpectrum, PSD, Octave Analysis
Octave Bandwidth Options1/3, 1/12 octave
Octave Standards ComplianceANSI S1.11-1986 Filter Shape
Averaging ModesRMS, Vector, Peak Hold
Averaging TypesLinear, Exponential, Peak Hold
Number of Averages1 to 65,536 (or infinite)
Display UnitsV, V², V²/Hz, Vrms, Vrms², Vrms/√Hz, dBV, dBm, dBV/√Hz

Triggering

ParameterValue
Trigger ModesContinuous, Internal, External
External Trigger InputTTL level, active high or low
Trigger DelayUp to 65,536 samples (pre- or post-trigger)

Display & Interface

ParameterValue
Floppy Disk Drive3.5-inch MS-DOS compatible, 1.44 MB or 720 KB
Data Export FormatsASCII, Binary

Power Specifications

ParameterValue
AC Voltage Selectable100 V, 120 V, 220 V, 240 V
AC Frequency Range50 Hz to 60 Hz

Storage & Memory

ParameterValue
Internal Setup Storage9 configurations
Internal Trace Storage100 traces (non-volatile)

Inputs & Outputs

ParameterValue
Printer InterfaceCentronics parallel port (Epson, HP LaserJet, and PostScript compatible)
Video Output ConnectorTTL monochrome, 18.2 kHz horizontal, 50 Hz vertical
External Trigger Input Impedance10 kΩ
External Trigger LevelTTL

Performance

ParameterValue
Amplitude Resolution0.01 dB

Communication

ParameterValue
RS-232 Baud RatesUp to 19.2 kbps
GPIB CapabilitiesSH1, AH1, T6, L4, SR1, RL1, PP0, DC1, DT1, C0, E2 (IEEE-488.2)

Measurement Functions

ParameterValue
Analysis FunctionsHarmonic Analysis (up to 20 harmonics), Band Analysis, Limit Testing (Pass/Fail), THD

Marker Functions

ParameterValue
Marker ModesDual, Track Peak, Next Peak, Band, Noise, 1/X

Signal Acquisition

ParameterValue
A/D Converter Resolution16-bit
A/D Converter Sampling Rate256 kHz
Anti-Aliasing Filter Type8-pole, elliptic low-pass

Phase

ParameterValue
Phase Accuracy±1.0° (DC to 50 kHz), ±1.25° (50 kHz to 100 kHz) relative to external trigger

Hardware & Connectivity

ParameterValue
Preamp Power Output±15 VDC at 100 mA (rear panel SRS connector)

Power

ParameterValue
Power Consumption60 W

Technology

FFT (Fast Fourier Transform)

Applications

Audio, acoustics, vibration, and noise measurements