The Stanford Research Systems SR850 is a high-performance 100 kHz DSP-based lock-in amplifier designed for high dynamic reserve, low drift, and outstanding phase resolution. Utilizing an innovative digital signal processing (DSP) architecture, it replaces traditional analog components with precise digital calculations, featuring an 18-bit A/D converter, integrated data logging, and versatile data analysis capabilities.
Specifications
General
| Parameter | Value |
|---|---|
| Interfaces | GPIB, RS-232, 3.5" floppy disk drive |
| Display | Flat panel display (CRT on older revisions) |
| Auto-Functions | Auto-gain, auto-phase, auto-reserve, auto-offset |
| Preamp Power Output | ±15 VDC, 100 mA (rear panel connector) |
Physical
| Parameter | Value |
|---|---|
| Power Supply | 100/120/220/240 VAC, 50/60 Hz, 60 W |
| Operating Temperature | 0 °C to 40 °C |
| Dimensions (W×H×D) | 432 mm × 159 mm × 495 mm |
| Weight | 18.1 kg |
Reference Channel
| Parameter | Value |
|---|---|
| Frequency Range | 1 mHz to 102.4 kHz |
| Phase Resolution | 0.001° |
| Reference Signal Options | External sine, external square, or internal digitally synthesized |
| Harmonic Detection | Any integer harmonic of reference frequency |
| External Reference Acquisition Time | 2 cycles + 5 ms or 40 ms (whichever is greater) |
| Channel Orthogonality | Within 0.001° |
| Reference Phase Drift | <0.01°/°C (below 10 kHz), <0.1°/°C (above 10 kHz) |
| Reference TTL Input Range | ≥1.2 V pk |
| Phase Noise | Internal: <0.0001° rms @ 1 kHz; External: <0.005° rms @ 1 kHz (100 ms, 12 dB/oct) |
Signal Channel
| Parameter | Value |
|---|---|
| Dynamic Reserve | >100 dB (without band-pass tracking filters) |
| A/D Converter | 18-bit precision |
| Input Signal Digitization Rate | 256 kHz |
| Input Configuration | Differential (A-B) or Single-ended (A) |
| Input Noise | 6 nV/√Hz at 1 kHz |
| Input Impedance | 10 MΩ + 25 pF |
| Full-Scale Input Sensitivity | 2 nV to 1 V |
| Current Input Gains | 10^6 V/A or 10^8 V/A |
| Line Interference Filters | 50/60 Hz and 100/120 Hz (2× line filter) |
| Gain Stability | <5 ppm/°C (DC coupled), <50 ppm/°C (AC coupled) |
Demodulator & Filtering
| Parameter | Value |
|---|---|
| Time Constants | 10 µs to 30 ks |
| Low-Pass Filter Rolloff | 6, 12, 18, or 24 dB/octave |
| Synchronous Filtering | Available below 200 Hz |
| Signal Demodulator Type | Digital DSP-based calculations |
Displays & Measurements
| Parameter | Value |
|---|---|
| Data Logging Memory | 65,536 points |
| Data Processing | Savitzky-Golay smoothing, curve-fitting, statistical analysis |
| Data Acquisition Rate | Up to 512 Hz |
| Display Formats | Numeric, bar graph, polar plot, strip chart |
Internal Oscillator
| Parameter | Value |
|---|---|
| Oscillator Distortion | -80 dBc (f < 10 kHz), -70 dBc (f > 10 kHz) |
| Oscillator Frequency Resolution | 0.1 mHz |
| Oscillator Amplitude Resolution | 2 mV |
| Internal Oscillator Sweeps | Linear or logarithmic |
| Oscillator Frequency Accuracy | ±25 ppm + 30 µHz |
| Oscillator Amplitude Accuracy | ±1% |
| Oscillator Amplitude Stability | 50 ppm/°C |
Auxiliary Inputs & Outputs
| Parameter | Value |
|---|---|
| Auxiliary A/D Inputs | 4 channels, ±10.24 V, 16-bit resolution |
| Auxiliary D/A Outputs | 4 channels, ±10.24 V, 16-bit resolution |
Oscillator
| Parameter | Value |
|---|---|
| Oscillator Amplitude Range | 4 µVrms to 5 Vrms |
| Oscillator Output Impedance | 50 Ω |
Data Storage
| Parameter | Value |
|---|---|
| Internal Memory Disk Drive | 3.5" MS-DOS compatible, 1.44 MB or 720 kB |
Inputs & Outputs
| Parameter | Value |
|---|---|
| CH1 and CH2 Outputs | ±10 V full scale, 40 Ω source impedance, 10 mA max |
| Auxiliary A/D Input Impedance | 1 MΩ |
| Auxiliary D/A Output Impedance | 40 Ω |
Interfaces
| Parameter | Value |
|---|---|
| Printer Interface | Centronics parallel port |
Power
| Parameter | Value |
|---|---|
| Power Consumption | 60 W |
| Line Voltage Options | 100 / 120 / 220 / 240 V AC (selectable), 50/60 Hz |
Technology
DSP (Digital Signal Processing)
Applications
Precision signal recovery, phase-sensitive detection, and low-level signal measurement