The Tektronix 370B is a high-performance, programmable semiconductor curve tracer that serves as the industry standard for characterization and testing of a wide variety of semiconductor devices, including diodes, transistors, thyristors, and field-effect transistors. Featuring digital storage, parameter measurement capabilities, and a built-in test fixture with a safety interlock, it enables safe and precise parametric measurements up to 2000 V or 10 A peak.
Specifications
General
| Parameter | Value |
|---|---|
| Interfaces | GPIB (IEEE-488.2), 3.5-inch Floppy Disk Drive (1.44 MB / 720 KB) |
| Display | 7-inch Electrostatic CRT with digital storage and readout |
| Warm-up Time | 20 minutes |
Physical
| Parameter | Value |
|---|---|
| Operating Temperature | 10 to 40 °C |
| Dimensions (W×H×D) | 397×192×554 mm |
| Weight | 32.0 |
Collector/Drain Sweep Supply
| Parameter | Value |
|---|---|
| Max Peak Voltage | 2000 V |
| Max Peak Current | 10 A |
| Peak Power Ranges | 0.1 W, 2 W, 30 W, 220 W |
| Sweep Voltage Ranges | 16 V, 80 V, 400 V, 2000 V |
| Sweep Polarities | Positive, Negative, AC |
Step Generator (Base/Gate Stimulus)
| Parameter | Value |
|---|---|
| Step Generator Output Modes | Current, Voltage |
| Current Step Range per Step | 50 nA to 200 mA in a 1-2-5 sequence |
| Voltage Step Range per Step | 50 mV to 2 V in a 1-2-5 sequence |
| Number of Steps Range | 0 to 10 steps |
| Step Polarity | Positive, Negative, Pulsed (Positive or Negative) |
| Step Offset Range | Variable up to ±10 times the step amplitude |
Horizontal Deflection System
| Parameter | Value |
|---|---|
| Collector Voltage Sensitivity Range | 50 mV/div to 200 V/div (magnified to 5 mV/div) |
| Base/Gate Voltage Sensitivity Range | 50 mV/div to 2 V/div (magnified to 5 mV/div) |
| Horizontal Accuracy | Within ±1.5% of readout (normal display) |
Vertical Deflection System
| Parameter | Value |
|---|---|
| Collector Current Sensitivity Range | 1 nA/div to 2 A/div (magnified to 100 pA/div) |
| Vertical Accuracy | Within ±1.5% of readout (normal display) |
Display & Measurement Capabilities
| Parameter | Value |
|---|---|
| Waveform Storage Capacity | Up to 80 non-volatile internal locations plus Floppy Disk storage |
| Setup Storage Capacity | Up to 80 non-volatile internal locations plus Floppy Disk storage |
| Display Modes | Store, View, Reference, Compare |
Input/Output & Remote Interfaces
| Parameter | Value |
|---|---|
| External Monitor Output | DB-9 female connector, analog RGB |
Test Fixture & Protection
| Parameter | Value |
|---|---|
| Standard Test Fixture | Integrated with protective safety cover and interlock |
| Kelvin Sensing Support | Yes, supported via compatible adapters |
Environmental Specifications
| Parameter | Value |
|---|---|
| Storage Temperature Range | -40 to +65 °C |
Auxiliary Voltage Supply
| Parameter | Value |
|---|---|
| Auxiliary Voltage Supply Range | -40 V to +40 V |
| Auxiliary Voltage Supply Max Current | 100 mA |
Storage
| Parameter | Value |
|---|---|
| Floppy Disk Drive | 3.5-inch MS-DOS compatible (1.44 MB or 720 KB) |
| Floppy Disk Format Compatibility | 3.5-inch MS-DOS (720 KB or 1.44 MB) |
Measurement & Display
| Parameter | Value |
|---|---|
| Cursor Modes | Dot, Window, Function (f(x)), Line (Tangent) |
Display Details
| Parameter | Value |
|---|---|
| CRT Display Type | 7-inch diagonal, electrostatic deflection with internal graticule |
Step Generator
| Parameter | Value |
|---|---|
| Step Generator Max Current Output | 2 A |
| Step Generator Max Voltage Output | 20 V |
Power
| Parameter | Value |
|---|---|
| AC Line Frequency Range | 48 Hz to 63 Hz |
| AC Line Voltage Range | 90 V to 250 V AC |
Safety & Protection
| Parameter | Value |
|---|---|
| Safety Interlock | Fixture enclosure interlock to disable high voltage when open |
Collector Supply
| Parameter | Value |
|---|---|
| Sweep Frequency | 100 Hz (at 50 Hz line frequency) / 120 Hz (at 60 Hz line frequency) |
General & Mechanical
| Parameter | Value |
|---|---|
| Cooling Method | Forced-air cooling |
Technology
Analog-Digital Hybrid Curve Tracer
Applications
Semiconductor Device Parametric Characterization and Testing