The Tektronix AFG3021B is a 1-channel 25 MHz Arbitrary/Function Generator from the AFG3000 Series. Featuring a 250 MS/s sample rate, 14-bit vertical resolution, 128 kpoint arbitrary waveform memory depth, and ±1 ppm/year frequency stability, it provides versatile signal generation for design, testing, and manufacturing applications.

Specifications

General

ParameterValue
InterfacesUSB (Front Host & Rear Device), GPIB, LAN (10/100 Base-T)
Warm-Up Time20 minutes

Physical

ParameterValue
Power Supply100 V to 240 V AC, 47 Hz to 63 Hz / 115 V AC, 360 Hz to 440 Hz, < 120 W
Operating Temperature0 °C to +50 °C
Dimensions (W×H×D)329.6 mm × 156.3 mm × 168.0 mm
Weight4.5 kg

Signal & Waveform Performance

ParameterValue
Number of Channels1
Standard Output WaveformsSine, Square, Pulse, Ramp, Triangle, Sin(x)/x, Exponential Rise, Exponential Decay, Gaussian, Lorentz, Haversine, Noise, DC
Sine Wave Frequency Range1 µHz - 25 MHz
Square Wave Frequency Range1 µHz - 12.5 MHz
Ramp/Triangle Frequency Range1 µHz - 250 kHz
Pulse Frequency Range1 mHz - 12.5 MHz
Arbitrary Waveform Frequency Range1 mHz - 12.5 MHz
Frequency Resolution1 µHz or 12 digits
Frequency Accuracy±1 ppm, 0 °C to 50 °C
Frequency Stability / Aging Rate±1 ppm per year

Waveform Characteristics & Purity

ParameterValue
Sine Total Harmonic Distortion (THD)< 0.2% (10 Hz to 20 kHz, 1 Vp-p)
Sine Phase Noise-110 dBc/Hz @ 10 kHz offset (10 MHz, 1 Vp-p)
Square Wave Rise/Fall Time≤ 18 ns
Square Wave Jitter< 500 ps rms
Pulse Width Range30 ns to 999.99 s
Pulse Edge Transition Time Range18 ns to 0.625 × pulse period

Arbitrary Waveform Capabilities

ParameterValue
Waveform Length2 to 128,000 points
Vertical Resolution14 bits
Sample Rate250 MS/s
Non-Volatile Memory Capacity4 waveforms

Modulation, Sweep & Burst Modes

ParameterValue
Modulation TypesAM, FM, PM, FSK, PWM
AM Modulation Depth0.0% to 120.0%
FM Maximum Deviation12.5 MHz
PM Phase Deviation0.0° to 180.0°
Sweep TypesLinear, Logarithmic
Sweep Time Range1 ms to 300 s
Burst Count1 to 1,000,000 cycles or Infinite

Output Specifications

ParameterValue
Output Impedance50 Ω
Output Amplitude Range (into 50 Ω)10 mVp-p to 10 Vp-p
Output Amplitude Range (Open Circuit)20 mVp-p to 20 Vp-p
Amplitude Accuracy±(1% of setting + 1 mVp-p) @ 1 kHz sine, 0 V offset, > 10 mVp-p
DC Offset Range±5 V into 50 Ω, ±10 V into open circuit

Inputs & Auxiliary Interfaces

ParameterValue
Main Output Connector TypeBNC (front panel)
External Modulation InputBNC (rear panel), ±1.0 V full scale, 10 kΩ input impedance
Reference Clock InputBNC (rear panel), 10 MHz
Reference Clock OutputBNC (rear panel), 10 MHz

Environmental & Safety Standards

ParameterValue
Storage Temperature-30 °C to +70 °C
Operating AltitudeUp to 3,000 m (9,843 ft)
Safety CertificationsUL 61010-1, CAN/CSA C22.2 No. 61010-1, EN 61010-1, IEC 61010-1

Waveform Characteristics

ParameterValue
White Noise Bandwidth (-3 dB)25 MHz

Sine Wave Performance

ParameterValue
Sine Flatness (< 5 MHz)±0.15 dB
Sine Flatness (5 MHz to 25 MHz)±0.3 dB
Non-Harmonic Spurious (DC to 25 MHz)DC to 1 MHz: < -60 dBc, 1 MHz to 25 MHz: < -50 dBc

Square Wave Performance

ParameterValue
Square Wave Overshoot< 5%

Modulation

ParameterValue
Internal Modulation Frequency Range2 mHz to 50 kHz
PWM Deviation Range0% to 50% of pulse period

Outputs

ParameterValue
Short Circuit ProtectionYes

Software & Control

ParameterValue
Included SoftwareArbExpress

Performance

ParameterValue
Ramp Symmetry Range0.0% to 100.0%
Ramp Linearity< 0.1% of peak output at 1 kHz

Modulation & Sweep

ParameterValue
Internal Modulation Source WaveformsSine, Square, Ramp, Noise, Arbitrary
Trigger SourcesInternal, External, Manual

Inputs & Outputs

ParameterValue
External Modulation Input Voltage Range±1.0 V full scale
External Modulation Input Impedance10 kΩ
External Trigger Input Impedance1 kΩ

Power & Environmental

ParameterValue
AC Line Voltage Range100 V to 240 V AC (±10%)
AC Line Frequency Range47 Hz to 63 Hz (100 V to 240 V), 390 Hz to 440 Hz (115 V)
Power Consumption< 120 W

Technology

Direct Digital Synthesis (DDS)

Applications

Electronic testing, design verification, sensor simulation, functional test, education