The Tektronix AWG610 is a high-performance, single-channel arbitrary waveform generator belonging to the AWG600 Series. It features a maximum sampling rate of 2.6 GS/s and an 8-bit digital-to-analog converter (DAC) resolution. Optimized for high-speed signal simulation, the AWG610 is designed for disk drive testing, high-speed serial data communication, baseband/IF modulation, and various biomedical and transducer simulations. It incorporates a large 8M-point memory depth, real-time sequencing capability, and complementary analog outputs with options for direct or amplified signal paths. Control and programming are supported via standard GPIB, LAN, and RS-232-C interfaces.

Specifications

Waveform & Channel Specifications

ParameterValue
Number of Channels1
Digital-to-Analog Converter Resolution8 bits
Maximum Sampling Rate2.6 GS/s
Minimum Sampling Rate50 kS/s

Analog Output Characteristics

ParameterValue
Output Impedance50 ohms

Marker & Digital Outputs

ParameterValue
Number of Marker Outputs2

Clock & Reference System

ParameterValue
External Clock Input Impedance50 ohms

Trigger & Run Modes

ParameterValue
Operating ModesContinuous, Triggered, Gated, Enhanced
External Trigger Input ConnectorBNC
External Trigger Input Impedance1 kohm or 50 ohms

Sequencer Specifications

ParameterValue
Maximum Sequence Steps8,000 steps
Loop Counter Range1 to 65,536 or Infinite

Physical & Environmental

ParameterValue
Cooling MechanismInternal Fan Forced Air Cooling

Mechanical, Standards & Compliance

ParameterValue
Form FactorBenchtop (rackmountable with optional kit)

Analog Output

ParameterValue
Low-Pass Filters20 MHz, 50 MHz, 100 MHz, 200 MHz, Thru (selectable)
Analog Add Input ConnectorBNC (rear panel)
Analog Add Input Impedance50 Ω

Auxiliary Inputs/Outputs

ParameterValue
Event Input ConnectorBNC (rear panel)
Event Input Impedance1 kΩ or 50 Ω (selectable)

Technology

Arbitrary Waveform Generation

Applications

High-speed Mixed Signal Generation, Disk Drive Testing, Serial Data Communication, Baseband/IF Modulation Testing