The Tektronix DG2030 is a high-performance Data Pattern Generator designed for testing high-speed logic devices and digital circuits. Operating at data rates up to 409.6 Mb/s with 256 Kwords of memory depth per channel, it delivers precise control over digital output parameters, including variable delay, output levels, and rise/fall times. It is ideal for logic characterization, digital functional verification, and automated test equipment (ATE) applications.
Specifications
General
| Parameter | Value |
|---|---|
| Interfaces | GPIB (IEEE-488.2), RS-232-C |
| Display | 9.5-inch Color TFT LCD, 640 × 480 pixels |
Physical
| Parameter | Value |
|---|---|
| Power Supply | 90 V to 250 V AC, 48 Hz to 63 Hz, 300 W max |
| Operating Temperature | 10 °C to 40 °C |
| Dimensions (W×H×D) | 362 mm × 185 mm × 490 mm |
| Weight | 10.5 kg |
Pattern and Channel Specs
| Parameter | Value |
|---|---|
| Number of Data Output Channels | 4 (standard), expandable to 8 (with Option 01) |
| Maximum Data Rate | 409.6 Mb/s |
| Minimum Data Rate | 0.1 b/s |
| Pattern Memory Depth per Channel | 256 Kwords (262,144 words) |
| Data Formats | NRZ |
| Channel-to-Channel Deskew Range | -2.5 ns to +5.0 ns |
| Channel-to-Channel Deskew Resolution | 10 ps (0.01 ns) |
Signal Levels and Electrical Characteristics
| Parameter | Value |
|---|---|
| Output Connector Type | SMB |
| Output Impedance | 50 Ω |
| Output Voltage High Level Range | -1.25 V to +3.50 V (into 50 Ω) |
| Output Voltage Low Level Range | -1.50 V to +3.25 V (into 50 Ω) |
| Output Amplitude Range | 0.10 Vp-p to 4.75 Vp-p (into 50 Ω) |
| Voltage Level Resolution | 5 mV |
| Output Rise Time (20% to 80%) | ≤ 800 ps |
| Output Fall Time (20% to 80%) | ≤ 800 ps |
| Output Tristate Control | High impedance (Hi-Z) selectable via inhibit or pattern data |
Clock and Timing Parameters
| Parameter | Value |
|---|---|
| Internal Clock Frequency Range | 0.1 Hz to 409.6 MHz |
| Internal Clock Frequency Resolution | 4 digits |
| Internal Clock Frequency Accuracy | ±10 ppm |
| External Clock Input Frequency Range | 10 Hz to 409.6 MHz |
| External Clock Input Impedance | 50 Ω |
| External Clock Input Connector | BNC (rear panel) |
| External Clock Input Threshold Range | -2.5 V to +2.5 V |
| External Clock Input Resolution | 0.1 V |
| External Clock Input Minimum Pulse Width | 1.2 ns |
| External Reference Clock Input (10 MHz) | BNC, 10 MHz, 1.0 Vp-p to 5.0 Vp-p, 1 kΩ |
| Reference Clock Output | BNC, 10 MHz, >1.2 Vp-p into 50 Ω |
| Clock Output Connector | SMB |
Sequencer and Triggering
| Parameter | Value |
|---|---|
| Maximum Number of Sequence Steps | 4096 |
| Maximum Loop Count | 65536 (or infinite) |
| Sequence Nested Loop Levels | 4 |
| External Trigger Input Connector | BNC (rear panel) |
| External Trigger Input Impedance | 10 kΩ |
| External Trigger Input Threshold Level | -2.5 V to +2.5 V |
| External Trigger Input Resolution | 0.1 V |
| Minimum External Trigger Pulse Width | 15 ns |
| Event Input Connector | SMB (rear panel) |
| Event Input Impedance | 1 kΩ |
| Event Input Threshold Level | -2.5 V to +2.5 V |
| Sync Output Connector | SMB |
| Sync Output Voltage Level | >1.0 V into 50 Ω |
System Connectivity and Interfaces
| Parameter | Value |
|---|---|
| GPIB Interface | IEEE-488.2 compliant |
| RS-232C Port | D-sub 9-pin |
| External Storage Medium | 3.5-inch Floppy Disk Drive (2HD/2DD, DOS format) |
| Command Language | SCPI compatible |
User Interface and Display
| Parameter | Value |
|---|---|
| Display Type | Color TFT LCD |
| Display Size | 9.5-inch |
| Display Resolution | 640 × 480 pixels |
| Built-in Editor Tools | Graphic pattern editor, table editor, block copy/paste, shift, invert |
Power Specifications
| Parameter | Value |
|---|---|
| AC Input Voltage Range | 90 V to 250 V AC |
| AC Line Frequency Range | 48 Hz to 63 Hz |
| Power Consumption | 300 W max |
Environmental and Physical Attributes
| Parameter | Value |
|---|---|
| Operating Temperature Range | +10 °C to +40 °C |
| Storage Temperature Range | -20 °C to +60 °C |
| Operating Humidity Range | 20% to 80% RH (non-condensing) |
| Storage Humidity Range | 5% to 90% RH (non-condensing) |
| Maximum Operating Altitude | 3000 m (10,000 ft) |
| Maximum Non-Operating Altitude | 12,000 m (40,000 ft) |
| Warm-up Time | 20 minutes |
| Unit Width | 362 mm |
| Unit Height | 185 mm (with feet) |
| Unit Depth | 490 mm |
| Unit Weight | 10.5 kg |
Compliance and Safety
| Parameter | Value |
|---|---|
| Safety Certifications | UL1244, CSA22.2, EN61010-1 |
| Electromagnetic Compatibility (EMC) Standards | EN55011, EN50082-1 |
Performance
| Parameter | Value |
|---|---|
| Internal Clock Jitter | < 50 ps rms (at 400 MHz) |
Inhibit Input
| Parameter | Value |
|---|---|
| Inhibit Input Connector | BNC (rear panel) |
| Inhibit Input Impedance | 1 kΩ |
| Inhibit Input Threshold Level | TTL compatible (High: >2.0 V, Low: <0.8 V) |
| Inhibit Input Minimum Pulse Width | 10 ns |
Connectivity
| Parameter | Value |
|---|---|
| GPIB Interface Functions | SH1, AH1, T6, L4, SR1, RL1, PP0, DC1, DT1, C0, E2 |
| Printer Port | Centronics parallel (DB-25) |
Environmental
| Parameter | Value |
|---|---|
| Operating Vibration | 0.27 Grms, 5 Hz to 500 Hz |
| Non-operating Vibration | 2.28 Grms, 5 Hz to 500 Hz |
| Operating Shock | 294 m/s² (30 G), half-sine, 11 ms duration |
Clock Sweep
| Parameter | Value |
|---|---|
| Frequency Sweep Range | 100 Hz to 400 MHz |
| Frequency Sweep Modes | Linear, Logarithmic |
| Frequency Sweep Time Range | 1 ms to 1000 s |
Setup Storage
| Parameter | Value |
|---|---|
| Internal Setup Memory | 3 configurations |
Clock Output
| Parameter | Value |
|---|---|
| Clock Output High Level Range | -2.0 V to +2.0 V (into 50 Ω) |
| Clock Output Low Level Range | -2.0 V to +2.0 V (into 50 Ω) |
| Clock Output Resolution | 0.1 V |
| Clock Output Rise and Fall Time | ≤ 1.5 ns (20% to 80%) |
Pattern Memory Architecture
| Parameter | Value |
|---|---|
| Minimum Block Size | 8 words |
| Block Size Increment | 8 words |
| Maximum Number of Blocks | 2048 |
Options
| Parameter | Value |
|---|---|
| Rackmount Kit | Option 1R |
Technology
Data Pattern Generator
Applications
Logic device characterization, digital circuit design, functional testing, and high-speed digital logic testing