The Tektronix P6249 is a high-performance 4 GHz active FET probe designed for high-speed digital design and debugging. Offering a rapid rise time of less than 120 ps, low input capacitance of under 1 pF, and a 4 Vp-p dynamic range, it provides excellent signal fidelity for probing small-geometry surface mount devices.
Specifications
General
| Parameter | Value |
|---|---|
| Interfaces | TekProbe II BNC |
Physical
| Parameter | Value |
|---|---|
| Power Supply | Powered directly via TekProbe II BNC interface, or via Tektronix 1103 TekProbe Power Supply |
| Operating Temperature | 0 °C to +50 °C |
Electrical Specifications
| Parameter | Value |
|---|---|
| Bandwidth | 4 GHz |
| Rise Time (10% to 90%) | < 120 ps (guaranteed) |
| Attenuation Ratio | 5X |
Input Characteristics
| Parameter | Value |
|---|---|
| Input Resistance | 20 kΩ |
| Input Capacitance | < 1.0 pF |
| Linear Dynamic Range | 4 Vp-p |
| Input Offset Range | ±22 V |
| Maximum Non-Destructive Input Voltage | ±15 V (DC + peak AC) |
Host Interface & Compatibility
| Parameter | Value |
|---|---|
| Host Oscilloscope Compatibility | Tektronix TDS7000B, CSA7000B, TDS6000B, TDS700, and TDS600 series |
| Alternative Interface Support | Compatible with conventional BNC interfaces via Tektronix 1103 TekProbe Power Supply |
Physical & Mechanical Properties
| Parameter | Value |
|---|---|
| Probe Head Form Factor | Small Form Factor |
| Cable Length | 1.3 m |
Performance
| Parameter | Value |
|---|---|
| Output Impedance | 50 Ω |
| Propagation Delay | 5.3 ns (typical) |
| DC Attenuation Accuracy | ±2% |
| System Noise | < 1.5 mV RMS |
Environmental
| Parameter | Value |
|---|---|
| Non-Operating Temperature | -55 °C to +75 °C |
| Operating Altitude | Up to 3,000 m |
| Non-Operating Altitude | Up to 15,240 m |
| Operating Humidity | 0% to 90% RH (at up to +30 °C), 0% to 75% RH (+30 °C to +50 °C) |
| Non-Operating Humidity | 0% to 90% RH (at up to +30 °C), 0% to 75% RH (+30 °C to +60 °C) |
Compliance
| Parameter | Value |
|---|---|
| Safety Certifications | UL3111-1, CSA1010.1, EN61010-1/A2 |
Technology
Active FET Probe
Applications
High-speed digital system design, semiconductor device characterization, and debugging