The Keithley 2410 is a High-Voltage SourceMeter (SMU) designed for precision testing of high-voltage components and materials. It offers 20 W of output power and can source and measure up to 1000 V and 1 A, featuring true 4-quadrant source and sink capabilities combined with a 5½-digit measurement resolution.
Specifications
General
| Parameter | Value |
|---|---|
| Interfaces | GPIB (IEEE-488), RS-232 |
| Display | Vacuum Fluorescent Display (VFD) |
| Warm-up Time | 1 hour to rated accuracies |
| Number of Channels | 1 |
Physical
| Parameter | Value |
|---|---|
| Operating Temperature | 0°C to 50°C |
| Dimensions (W×H×D) | 213 × 89 × 370 |
| Weight | 3.21 |
| Cooling | Convection |
| Form Factor | 2U, half-rack width |
Voltage Source Specifications
| Parameter | Value |
|---|---|
| Maximum Output Voltage | ±1000 V |
| Maximum Output Power | 20 W |
Current Source Specifications
| Parameter | Value |
|---|---|
| Maximum Output Current | ±1 A |
Performance Specifications
| Parameter | Value |
|---|---|
| Resolution | 5½ digits |
| Quadrant Operation | 4-Quadrant (Source and Sink) |
Connectivity and Interfaces
| Parameter | Value |
|---|---|
| Trigger I/O | Keithley Trigger Link |
| Digital I/O | Yes |
Software and Control
| Parameter | Value |
|---|---|
| Programming Command Set | SCPI |
Environmental
| Parameter | Value |
|---|---|
| Storage Temperature | -25°C to 65°C |
Performance
| Parameter | Value |
|---|---|
| Basic DC Voltage Accuracy | 0.012% |
| Source Delay | 0 to 9999.999 s |
| Source Functions | DC Voltage, DC Current |
| Measurement Functions | DC Voltage, DC Current, Resistance |
| Voltage Ranges | ±200 mV, ±2 V, ±20 V, ±1000 V |
| Sweep Modes | Linear Staircase, Logarithmic Staircase, Custom List, Source-Memory |
Inputs & Outputs
| Parameter | Value |
|---|---|
| Common Mode Isolation | 250V DC |
| Measurement Connections | 2-wire (local), 4-wire (remote), and Guard |
Features
| Parameter | Value |
|---|---|
| Limit Testing | Built-in Pass/Fail comparator |
Technology
Source Measure Unit (SMU)
Applications
High Voltage Device Characterization and Test