The Keysight 16453A is a dielectric material test fixture designed for high-frequency permittivity and loss tangent measurements of solid materials from 1 MHz to 1 GHz.
Specifications
General
| Parameter | Value |
|---|---|
| Interfaces | APC-7 (7 mm) |
| Included Accessories | Carrying case, Teflon calibration plate, Shorting plate, Tweezers |
Physical
| Parameter | Value |
|---|---|
| Operating Temperature | -30 °C to +85 °C |
| Dimensions (W×H×D) | 130 mm × 50 mm × 80 mm |
| Weight | 0.6 kg |
| Electrode Diameter | 7 mm |
Electrical Specifications
| Parameter | Value |
|---|---|
| Frequency Range | 1 MHz to 1 GHz |
| Maximum AC Voltage | ±42 V peak max. (AC + DC) |
| Maximum DC Bias Voltage | ±42 V peak max. (AC + DC) |
DUT Compatibility
| Parameter | Value |
|---|---|
| Compatible Material Type | Solid sheet or film |
| Minimum Sample Diameter | 15 mm |
| Sample Thickness Range | 0.3 mm to 3 mm |
Performance
| Parameter | Value |
|---|---|
| Measurement Method | Parallel plate method |
| Typical Permittivity Range | 1 to 40 |
| Measurement Parameters | Relative permittivity (εr'), loss tangent (tan δ) |
| Typical Accuracy (Permittivity) | ±5% (typical, at 1 GHz, sample thickness = 1 mm, εr' = 10) |
| Typical Accuracy (Loss Tangent) | ±0.005 (typical, at 1 GHz, sample thickness = 1 mm, εr' = 10, tan δ = 0) |
Instrument Connections
| Parameter | Value |
|---|---|
| Instrument Connector | APC-7 (7 mm) |
Instrument Compatibility
| Parameter | Value |
|---|---|
| Compatible Instruments | Keysight E4991A, E4991B, 4291A, 4291B |
Physical and Environmental
| Parameter | Value |
|---|---|
| Storage Temperature Range | -40 °C to +85 °C |
Calibration and Compensation
| Parameter | Value |
|---|---|
| Calibration Standards Included | Shorting plate, Load plate |
Environmental
| Parameter | Value |
|---|---|
| Operating Humidity | 20% to 80% RH (wet-bulb temperature ≤ 29 °C, non-condensing) |
| Storage Humidity | 20% to 80% RH (wet-bulb temperature ≤ 29 °C, non-condensing) |
Technology
Parallel plate method
Applications
Dielectric material permittivity and loss tangent measurement
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