The Keysight (Agilent HP) 4145B is a fully automatic, high-performance semiconductor parameter analyzer designed for the DC characterization and analysis of semiconductor devices. It features four built-in Source/Monitor Units (SMUs), two Voltage Source Units (VSUs), and two Voltage Monitor Units (VMUs), with a built-in interactive graphics CRT display and a 3.5-inch flexible-disc drive.

Specifications

General

ParameterValue
InterfacesGPIB (HP-IB)
Display16 cm (6.25 in) diagonal CRT, electrostatic focus/deflection, post accelerated, aluminized P-31 phosphor, 2048 x 2048 resolution
Warm-up Time40 minutes
Self-Test CapabilityBuilt-in automatic self-test and diagnostics

Physical

ParameterValue
Power Supply100/120/220 V AC +/-10%, 240 V AC -10% +5%, 48 to 66 Hz, 280 VA max
Operating Temperature10 to 40 °C
Dimensions (W×H×D)426 mm x 235 mm x 612 mm
Weight27 kg

System Configuration & Channels

ParameterValue
Total Measurement Channels8 channels
Source/Monitor Units (SMU)4 channels
Voltage Source Units (VSU)2 channels
Voltage Monitor Units (VMU)2 channels
Maximum Withstand Voltage100 V
Maximum Voltage between Common and GNDLess than +/-42 V

SMU Specifications

ParameterValue
SMU Modes of OperationVoltage source/current monitor (V), current source/voltage monitor (I), common (COM)
SMU Sweep WaveformsLinear or logarithmic sweep, constant
SMU 20V Range Max Voltage+/-20 V
SMU 20V Range Resolution1 mV
SMU 20V Range Max Current100 mA
SMU 40V Range Max Voltage+/-40 V
SMU 40V Range Resolution2 mV
SMU 40V Range Max Current50 mA
SMU 100V Range Max Voltage+/-100 V
SMU 100V Range Resolution5 mV
SMU 100V Range Max Current20 mA
SMU Current Range+/-1000 pA to +/-100 mA
SMU Current Ranging ModeAutomatic ranging
Maximum SMU Output Power2 W per SMU

Display & Analysis Functions

ParameterValue
Display ModesGRAPHICS, LIST, MATRIX, SCHMOO, and TIME DOMAIN
Cursor TypesLONG and SHORT (two intersecting perpendicular lines)
Cursor Coordinates DisplayX, Y1, and Y2 coordinates digitally displayed on CRT
Analysis ToolsOverlay graph comparison, auto retrieve function, marker movement on a plotted curve, interpolation
Softkey FunctionsAUTO SCALE, STORE, RECALL, CURSOR, MARKER, vertical and horizontal ZOOM, LINE (two), GRAD, 1/GRAD, X intercept, Y intercept, INTERPOLATE
User-Defined FunctionsUp to two USER FUNCTIONs defined as arithmetic expressions
Arithmetic Operators SupportedArithmetic operators, common and natural log, Napierian constant, exponentiation, absolute, scientific notation, differential calculation
Keyboard OperationArithmetic expressions executed via EXECUTE key
Stored Physical ConstantsThree permanently stored physical constants (7-digit internal accuracy, 5-digit display)

Storage & Interfaces

ParameterValue
Internal Storage Media3.5-inch micro flexible-disc drive
Floppy Disc FormatDouble-sided, double-density, 630K bytes

Accessories

ParameterValue
Included Shielded Test FixtureHP 16058A
Included DUT Boards8 interchangeable boards (diodes, 3/4-terminal transistors, 8/10/12-pin devices, 18/24-pin DIP ICs)

Voltage Source Units (VSU)

ParameterValue
VSU Output Voltage Range±20.00 V
VSU Output Voltage Resolution2 mV
VSU Maximum Output Current100 mA

Voltage Monitor Units (VMU)

ParameterValue
VMU Input Voltage Ranges±2 V, ±20 V
VMU Maximum Resolution20 µV (on ±2 V range)
VMU Input Impedance≥10 GΩ

Pulse Generator Units (PGU)

ParameterValue
PGU Quantity0

Source/Monitor Units (SMU)

ParameterValue
SMU Minimum Current Measurement Resolution1 pA (on 1 nA range)

Power Requirements

ParameterValue
Line Voltage90-110 V / 104-126 V / 194-236 V / 208-250 V (switchable)
Line Frequency48 Hz to 66 Hz
Power Consumption280 VA maximum

Measurement Configuration

ParameterValue
Integration TimesShort (~2.1 ms at 60 Hz, 2.5 ms at 50 Hz), Medium (1 PLC), Long (16 PLC)
Hold Time Range0 to 650.0 s
Hold Time Resolution100 ms
Hold Time Accuracy±(0.1% + 10 ms)
Delay Time Range0 to 6.500 s
Delay Time Resolution1 ms
Delay Time Accuracy±(0.1% + 100 μs)
Step Delay Time Range0 to 6.500 s
Step Delay Time Resolution1 ms
Step Delay Time Accuracy±(0.1% + 100 μs)
Maximum Sweep Steps1001 steps (linear sweep), 1 to 11 decades (log sweep)

Technology

Semiconductor Parametric Testing

Applications

DC evaluation of semiconductor devices, materials, IC design validation, and process control