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4155B

Keysight Technologies (Agilent HP)Semiconductor

The Keysight (Agilent/HP) 4155B is a high-performance Semiconductor Parameter Analyzer designed for precise parametric characterization of semiconductor devices. Equipped with four Medium-Power SMUs (MPSMUs), two Voltage Source Units (VSUs), and two Voltage Monitor Units (VMUs), it offers exceptional sweep and sampling capabilities for laboratory research and production testing. Its built-in 8.4-inch color display and integrated IBASIC programming language enable independent and automated testing without requiring an external computer.

Component TestingSemiconductor TestingSource Measure Unit

Specifications

General

ParameterValue
InterfacesGPIB (IEEE-488), Parallel (Centronics), External Trigger, Keyboard (Mini-DIN)
Display8.4-inch active-matrix color LCD, 640 x 480 pixels

Physical

ParameterValue
Power Supply90 V to 264 V AC, 47 Hz to 63 Hz, 450 VA maximum
Operating Temperature10 °C to 40 °C

System Configuration

ParameterValue
Number of Medium-Power SMUs (MPSMU)4
Number of Voltage Source Units (VSU)2
Number of Voltage Monitor Units (VMU)2
Ground Unit (GNDU) Maximum Current1.6 A
Expander Unit SupportSupports Agilent 41501A/B SMU/PGU Expander
Maximum SMU Channels (with Expander)6 (4 built-in MPSMUs + 2 additional MPSMUs / HPSMUs via 41501B)
Pulse Generator Unit (PGU) SupportUp to 2 channels (via 41501B Expander)

SMU Voltage Performance

ParameterValue
SMU Maximum Voltage Output Range±2 V to ±100 V
SMU Maximum Voltage100 V
SMU Voltage Programming Resolution (2 V Range)100 µV
SMU Voltage Programming Resolution (20 V Range)1 mV
SMU Voltage Programming Resolution (40 V Range)2 mV
SMU Voltage Programming Resolution (100 V Range)5 mV
SMU Voltage Measurement Resolution (2 V Range)10 µV
SMU Voltage Measurement Resolution (20 V Range)100 µV
SMU Voltage Measurement Resolution (40 V Range)200 µV
SMU Voltage Measurement Resolution (100 V Range)500 µV

SMU Current Performance

ParameterValue
SMU Maximum Current Output100 mA
SMU Current Ranges1 nA, 10 nA, 100 nA, 1 µA, 10 µA, 100 µA, 1 mA, 10 mA, 100 mA
SMU Minimum Current Range1 nA
SMU Current Measurement Resolution (1 nA Range)10 fA
SMU Current Measurement Resolution (10 nA Range)100 fA
SMU Current Measurement Resolution (100 nA Range)1 pA
SMU Current Measurement Resolution (1 µA Range)10 pA
SMU Current Measurement Resolution (10 µA Range)100 pA
SMU Current Measurement Resolution (100 µA Range)1 nA
SMU Current Measurement Resolution (1 mA Range)10 nA
SMU Current Measurement Resolution (10 mA Range)100 nA
SMU Current Measurement Resolution (100 mA Range)1 µA
SMU Current Programming Resolution (1 nA Range)100 fA
SMU Current Programming Resolution (10 nA Range)1 pA
SMU Current Programming Resolution (100 nA Range)10 pA
SMU Current Programming Resolution (1 µA Range)100 pA
SMU Current Programming Resolution (10 µA Range)1 nA
SMU Current Programming Resolution (100 µA Range)10 nA
SMU Current Programming Resolution (1 mA Range)100 nA
SMU Current Programming Resolution (10 mA Range)1 µA
SMU Current Programming Resolution (100 mA Range)10 µA
SMU Maximum Output Power2 W

Voltage Source Unit (VSU)

ParameterValue
VSU Output Channels2
VSU Output Range±20 V

Voltage Monitor Unit (VMU)

ParameterValue
VMU Input Channels2
VMU Voltage Measurement Range±2 V, ±20 V

Sweep & Measurement Capabilities

ParameterValue
Maximum Sweep Steps1001
Hold Time Range0 to 655.35 s
Delay Time Range0 to 65.535 s
Integration Time SettingsShort, Medium, Long
Maximum Sampling Points10001

User Interface & Software

ParameterValue
Storage Drive Type3.5-inch Floppy Disk Drive (FDD), 1.44 MB
Built-in Programming LanguageHP Instrument BASIC (IBASIC)

Power & Environmental

ParameterValue
Maximum Power Consumption450 VA

Rear Panel Connections

ParameterValue
SMU Connector TypeTriaxial (3-axis)
VSU Connector TypeBNC
VMU Connector TypeBNC
GNDU Connector TypeTriaxial (3-axis)
Safety Interlock TerminalYes (rear panel)

Ground Unit (GNDU)

ParameterValue
GNDU Output Voltage0 V

System Performance

ParameterValue
Warm-Up Time40 minutes

Technology

Semiconductor Characterization

Applications

Parametric Testing and Device Characterization