The Keysight Technologies (formerly Agilent / HP) 4156A is a high-precision semiconductor parameter analyzer engineered for accurate device characterization. It comes equipped with four built-in High-Resolution Source/Monitor Units (HRSMUs), two Voltage Source Units (VSUs), two Voltage Monitor Units (VMUs), and a Ground Unit (GNDU), delivering sub-femptoampere current measurement and microvolt-level voltage control for precise parametric testing.

Specifications

General

ParameterValue
InterfacesGPIB (HP-IB), Parallel (Centronics), External I/O, Interlock, Analog Monitor Output
Display9-inch color CRT

Physical

ParameterValue
Power Supply90 V to 264 V AC, 47 Hz to 63 Hz, 450 VA maximum power consumption
Operating Temperature10°C to 40°C
Dimensions (W×H×D)426 mm × 235 mm × 524 mm
Weight21 kg

System Configuration & Architecture

ParameterValue
Mainframe Module Capacity4x HRSMU, 2x VSU, 2x VMU, 1x GNDU
Maximum Supported Source Monitor Units6 (with 41501A/B expander)
Ground Unit Output0 V ±100 µV

Source Monitor Unit Specs

ParameterValue
Maximum Voltage Range (HRSMU)±100 V
Maximum Current Range (HRSMU)±100 mA
Voltage Programming Resolution (HRSMU)100 µV (on 2 V range)
Current Programming Resolution (HRSMU)10 fA (on 10 pA range)
Voltage Measurement Resolution (HRSMU)2 µV (on 2 V range)
Current Measurement Resolution (HRSMU)1 fA (on 10 pA range)
Maximum Output Power per Channel (HRSMU)2 W
Sensing Configuration TypeKelvin (4-wire connection)
Guarding and Shielding MethodTriaxial guarding

High-Resolution SMU Performance

ParameterValue
Minimum Current Measurement Range10 pA
Minimum Current Resolution1 fA
Minimum Voltage Resolution2 µV

Voltage Source Unit Specs

ParameterValue
Voltage Source Unit (VSU) Channels2
VSU Output Voltage Range±20 V
VSU Voltage Resolution20 mV
VSU Maximum Output Current100 mA

Voltage Monitor Unit Specs

ParameterValue
Voltage Monitor Unit (VMU) Channels2
VMU Voltage Resolution0.2 µV (on 0.2 V range)

Measurement Modes & Sweep Capabilities

ParameterValue
Supported Sweep ModesLinear, Logarithmic, Single, Double, Pulsed Sweep
Maximum Sweep Step Count1001 points
Hold Time Range0 to 655.35 s
Delay Time Range0 to 65.535 s
Pulse Width Range0.5 ms to 100 ms
Pulse Period Range5 ms to 1 s
Minimum Sampling Interval60 µs
Maximum Sampling Points10001 points
Stress Force Time Range1 ms to 65535 s

Inputs, Outputs & Interfacing

ParameterValue
Triaxial Connector Count8x HRSMU triaxial connectors (4x Force, 4x Sense), 1x GNDU triaxial connector
Ground Unit Connector TypeTriaxial
Safety Interlock Connector6-pin connector
Analog Monitor Output Ports2 channels (BNC connectors)
Trigger Input and Output PortsBNC connectors

Software, Control & Data Analysis

ParameterValue
Built-in Storage Media Type3.5-inch Floppy Disk Drive (FDD)
Math Function SupportBuilt-in mathematical and automated parameter extraction analysis

Electrical, Physical & Environmental

ParameterValue
Storage Temperature Range-30°C to 60°C

SMU Specifications

ParameterValue
Built-in HRSMU Channels4

System Configuration

ParameterValue
Total Mainframe Channels8 (4 x HRSMU, 2 x VSU, 2 x VMU)

System Expansion

ParameterValue
Supported Expander UnitHP / Agilent 41501A or 41501B

Measurement Capabilities

ParameterValue
Quasi-Static C-V (QSCV) SupportYes
VMU Measurement ModesSingle-ended, Differential
Ranging ModesAuto, Manual

Power Requirements

ParameterValue
Line Power Frequency47 Hz to 63 Hz
Line Power Voltage90 V to 132 V, 198 V to 264 V (automatic selection)

Operating Specifications

ParameterValue
Recommended Warm-up Time40 minutes

Measurement Settings

ParameterValue
Integration Time ModesShort, Medium, Long

Ground Unit (GNDU)

ParameterValue
GNDU Maximum Sink Current1.6 A
GNDU Output Voltage0 V ± 100 μV

Interfaces

ParameterValue
External Keyboard Connector TypeMini-DIN 6-pin (PS/2)
GP-IB Compliance StandardsIEEE 488.1, IEEE 488.2

Storage

ParameterValue
Supported Floppy Disk Formats3.5-inch (1.44 MB MS-DOS / 720 KB LIF)

Compliance

ParameterValue
Safety Compliance StandardsCSA C22.2 No. 1010.1, IEC 61010-1, EN 61010-1
EMC Compliance StandardsEN 55011 Group 1 Class A, EN 50082-1

Technology

Semiconductor Parameter Analysis

Applications

Semiconductor Device Characterization and Parametric Testing