The Keysight (Agilent) 4156C Precision Semiconductor Parameter Analyzer is a highly accurate laboratory instrument designed for the detailed characterization and parametric testing of semiconductor devices, materials, and processes. Equipped with four built-in high-resolution Source/Monitor Units (HRSMUs), two Voltage Monitor Units (VMUs), and two Voltage Program Units (VPUs), it offers exceptional current resolution down to 1 fA, making it ideal for low-leakage measurements, transistor curve tracing, and reliability evaluations.

Specifications

General

ParameterValue
InterfacesGPIB, LAN (10Base-T), Parallel (Centronics)
Display8.4-inch color active matrix LCD (640 × 480 VGA)
Required Warm-up Time40 minutes

Physical

ParameterValue
Power Supply90 V to 264 V AC, 47 Hz to 63 Hz, 450 VA maximum
Operating Temperature10 °C to 40 °C
Dimensions (W×H×D)426 mm × 235 mm × 524 mm
Weight21 kg

System Configuration & Channels

ParameterValue
Number of High-Resolution SMU (HRSMU) Channels4
Voltage Monitor Unit (VMU) Channels2
Voltage Program Unit (VPU) Channels2
Ground Unit (GNDU) Configuration1 (Standard)
Ground Unit Max Sink Current1.6 A

SMU Source & Measurement Performance

ParameterValue
HRSMU Maximum Voltage Force Range±100 V
HRSMU Maximum Current Force Range±100 mA
HRSMU Voltage Force Resolution2 µV (on 2 V range)
HRSMU Current Force Resolution10 fA (on 10 pA range)
HRSMU Voltage Measurement Range±2 V to ±100 V
HRSMU Current Measurement Range±10 pA to ±100 mA
HRSMU Voltage Measurement Resolution2 µV (on 2 V range)
HRSMU Current Measurement Resolution1 fA (on 10 pA range)
Maximum Output Power per HRSMU Channel10 W
Guarding and Shielding ConfigurationKelvin (force, sense, and guard triaxial outputs)

VMU & VPU Performance

ParameterValue
VMU Voltage Measurement Range±2 V, ±20 V
VMU Maximum Voltage Measurement Resolution0.2 µV (on 2 V range)
VMU Input Impedance≥ 10 GΩ
VPU Output Voltage Range±40 V
VPU Maximum Current100 mA
VPU Pulse Output ModesDC, Pulse, Dual-channel Pulse
VPU Pulse Width Range20 µs to 10.4 s
VPU Pulse Period Range100 µs to 20 s

Measurement Modes & Functions

ParameterValue
Sweep Measurement ModesLinear, Logarithmic, Single, Double
Maximum Number of Sweep Steps1001
Sampling Measurement Points1 to 10001
Minimum Sampling Interval60 µs
Integration Time SettingsShort, Medium, Long
Hold Time Range0 to 655.35 s
Delay Time Range0 to 65.535 s
Stress Force ModesDC, Pulse

Controller & User Interface

ParameterValue
Internal Storage Drive Type3.5-inch Floppy Disk Drive (FDD), 1.44 MB
Supported Storage File FormatsHP LIF, DOS/MS-DOS
Internal Programming Language SupportInstrument BASIC (IBASIC)
Keyboard Interface PortPS/2 mini-DIN

Connectivity & Interfaces

ParameterValue
SMU Connector TypeTriaxial
VMU Connector TypeBNC
VPU Connector TypeBNC
GNDU Connector TypeTriaxial
Interlock Connector Type6-pin circular
GPIB Interface Port24-pin IEEE-488

Environmental & Safety Compliance

ParameterValue
Operating Humidity Range20% to 70% RH (non-condensing)
Storage Temperature Range-20 °C to 60 °C
Cooling MethodForced-air cooling (internal fan with rear exhaust)

Environmental

ParameterValue
Maximum Operating Altitude2,000 m
Maximum Storage Altitude4,572 m

Compliance

ParameterValue
Safety Compliance StandardsEN61010-1, CAN/CSA-C22.2 No. 1010.1
EMC Compliance StandardsEN55011 Group 1 Class A, EN50082-1

Connectivity

ParameterValue
R-Box Control Port15-pin D-sub
Selector Control Port9-pin D-sub
Trigger Input PortBNC
Trigger Output PortBNC

Interfaces

ParameterValue
LAN Interface10Base-T (RJ-45) port
Parallel Interface25-pin Centronics parallel port

Power Supply

ParameterValue
AC Line Voltage90 V to 264 V
AC Line Frequency47 Hz to 63 Hz
Maximum Power Consumption450 VA

System Compatibility

ParameterValue
Expander CompatibilitySupports Agilent 41501A/B SMU and Pulse Generator Expander

Measurement Performance

ParameterValue
Sampling Time Stamp Resolution100 µs
Differential VMU Voltage Ranges±0.2 V and ±2.0 V

Technology

Precision Semiconductor Parameter Analyzer

Applications

Semiconductor device characterization, parametric testing, low-current measurement, transistor curve tracing, and device reliability testing