The Keysight (formerly Agilent / HP) 41952A is a 50 Ω Transmission/Reflection Test Set designed for use with the HP 4195A Network/Spectrum Analyzer. Operating over a frequency range of 100 kHz to 500 MHz, it enables convenient transmission and reflection measurements, and features a DC bias input for testing components under bias.
Specifications
General
| Parameter | Value |
|---|---|
| Interfaces | None (Passive RF device) |
Physical
| Parameter | Value |
|---|---|
| Power Supply | None (Passive device) |
| Operating Temperature | 0 °C to 55 °C |
| Dimensions (W×H×D) | 190 mm × 55 mm × 250 mm |
| Weight | 1.5 kg |
Frequency & Impedance
| Parameter | Value |
|---|---|
| Frequency Range | 100 kHz to 500 MHz |
| Nominal Impedance | 50 Ω |
Port Configurations & Connectors
| Parameter | Value |
|---|---|
| RF Input Connector Type | N-type (female), 50 Ω |
| Test Port Connector Type | N-type (female), 50 Ω |
| Reference Port Connector Type | N-type (female), 50 Ω |
| Test Output Port Connector Type | N-type (female), 50 Ω |
| DC Bias Input Port Type | BNC (female) |
Electrical & DC Bias Limits
| Parameter | Value |
|---|---|
| Maximum DC Bias Voltage | ±40 V |
| Maximum DC Bias Current | ±100 mA |
Compatibility & Accessories
| Parameter | Value |
|---|---|
| Compatible Host Network Analyzer | HP 4195A |
Environmental
| Parameter | Value |
|---|---|
| Operating Humidity | ≤ 95% RH @ 40 °C (non-condensing) |
| Storage Temperature | -40 °C to 70 °C |
Performance
| Parameter | Value |
|---|---|
| Equivalent Directivity | ≥ 40 dB (100 kHz to 500 MHz, after calibration) |
| Equivalent Source Match | ≥ 30 dB (100 kHz to 500 MHz, after calibration) |
| Nominal Insertion Loss | 10 dB (from input to test or reference port) |
| Equivalent Load Match | >= 30 dB (100 kHz to 200 MHz), >= 26 dB (200 MHz to 500 MHz) |
RF Specifications
| Parameter | Value |
|---|---|
| Maximum RF Input Power | +20 dBm |
Power
| Parameter | Value |
|---|---|
| Power Requirements | None (passive) |
Technology
RF Transmission/Reflection Test Set
Applications
Network Analysis, RF Device Characterization