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Keysight Technologies (Agilent HP) — Test Sets
26 models with full specifications in Test Sets.
This page summarises Keysight (formerly Agilent / HP) products in the Test Sets category and explains how the portfolio is organised so engineers can pick the right instrument for lab, production or field work. The range includes passive transmission/reflection (TR) kits and VNA test sets with precision ports, multiport adapters for ENA series VNAs, integrated wireless communications platforms that emulate base stations, and specialised noise and phase‑noise test hardware. Examples are drawn from representative models to show where each class fits: VNA test sets for high‑dynamic‑range S‑parameter work, TR kits for straightforward two‑port checks, communications test platforms for mobile device and base‑station verification, and dedicated phase/noise instruments for oscillator and amplifier characterisation.
- Frequency coverage (examples)
- DC (87512A, 85131F) up to 50 GHz (8517B, 8516A)
- Portable base‑station test set
- E7495B — 375 MHz to 2.7 GHz; internal Li‑Ion batteries
- Multiport capability
- E5092A — up to 10 ports (single) / 22 ports (dual with two test sets)
- High‑rate transmission testing
- J2127A — supports line rates up to 10 Gb/s (OC‑192/STM‑64)
- Precision 7 mm (APC‑7) test ports
- Available on several TR and S‑parameter test sets (e.g., 85044A, 85046A, 85047A)
All models
| Model | Type | Interfaces | Operating Temperature | Dimensions (W×H×D) |
|---|---|---|---|---|
| 8920B | RF Communications | GPIB (IEEE-488), RS-232, PCMCIA (2x Type II), External Reference Input/Output (BNC), Trigger Input/Output (BNC), RF Input (N-type), RF Output (N-type), Audio Input (BNC), Audio Output (BNC), Microphone Input, Speaker Output | 0 to 55 °C | 426 mm (W) × 178 mm (H) × 584 mm (D) |
| N4010A | *misc | — | — | — |
| E5515C | RF Communications | GPIB, LAN | — | — |
| J2127A | *misc | — | — | — |
| 85046A | S Parameter | Proprietary interconnect cable (controlled by host network analyzer) | 0 to 55 °C | — |
| 43961A | RF Communications | — | — | — |
| 85047A | S Parameter | Special multi-pin interconnect cable to network analyzer, BNC female DC bias inputs | 0 to 55 °C | — |
| 85131F | *misc | — | — | — |
| E6651A | *misc | — | — | — |
| 8517B | S Parameter | 8510 Test Set Interconnect (controlled by 8510 VNA system) | 0 to 55 °C | 425 mm × 133 mm × 508 mm |
| 8920A | RF Communications | GPIB (IEEE-488.2), RS-232, Parallel Printer Port (typically with Option 003) | 0 to +55 °C | 330 mm × 188 mm × 456 mm |
| N5182A-503 | RF Communications | GPIB, LAN (100Base-T), USB 2.0 Host, USB 2.0 Device, LXI Class C | 0 to 55 °C | 426 mm × 88 mm × 489 mm |
| 41952A | *misc | None (Passive RF device) | 0 °C to 55 °C | 190 mm × 55 mm × 250 mm |
| 87512A | *misc | — | 0 °C to 55 °C | 180 mm × 61 mm × 187 mm |
| 11729C | Noise | HP-IB (IEEE-488) | 0 to +55 °C | 425 mm × 177 mm × 524 mm |
| 3708A | Noise | HP-IB | 0 to +55 °C | 425 mm × 177 mm × 625 mm |
| 8514B | S Parameter | HP 8510 Test Set Interconnect (proprietary multi-pin interface) | 0 to 55 °C | 425 mm × 133 mm × 508 mm |
| E5092A | *misc | USB (Type-B, for control from E5071C VNA) | 5 °C to 40 °C | 426 mm × 132 mm × 341 mm |
| E7495B | *misc | LAN (10/100 Base-T), USB 1.1 Host, RS-232 Serial, PCMCIA (Type II) | 0 to 50 °C | 310 mm × 244 mm × 114 mm |
| E8285A | CDMA | GPIB (IEEE-488), RS-232 serial, Parallel (Centronics) | 0 to 55 °C | 426 mm × 177 mm × 574 mm |
| 85044A | *misc | RF Input (Type-N female), Test Port (Precision 7 mm), Transmission Port (Type-N female) | 0 to +55 °C | 425 mm x 132 mm x 505 mm |
| 85046B | S Parameter | Special system interconnect cable interface | 0 to 55 °C | 426 mm × 90 mm × 503 mm |
| 8516A | S Parameter | HP 8510 System Interface | 0 to 55 °C | 425 mm × 133 mm × 508 mm |
| 8922S | GSM | GPIB | 0 to +55 °C | 426 mm × 177 mm × 574 mm |
| 8971C | Noise | HP-IB (GPIB) | 0 to 55 °C | 425 mm × 146 mm × 476 mm |
| N5500A | *misc | GPIB (IEEE-488) | 0 °C to +55 °C | 426 mm × 177 mm × 546 mm |
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How the Keysight test‑set lineup is structured
The product set splits into clear functional classes. Passive transmission/reflection (TR) kits and test sets such as 85044A and 87512A are simple two‑port add‑ons that let a host analyzer perform reflection and transmission measurements. VNA‑oriented S‑parameter test sets (for example 8514B, 8516A, 8517B, 85046A, 85047A) are controlled by their host network analyzers and are built for higher frequency and directivity performance with precision connectors (APC‑7, 3.5 mm, 2.4 mm). Multiport test sets such as E5092A extend ENA VNAs to 10 ports (or up to 22 ports using two test sets).
Communications test platforms are a separate group: integrated radio test sets and base‑station emulators like E5515C (8960 Series hardware), E8285A (CDMA/PCS/AMPS family), 8920A/8920B (RF communications test sets), 8922S (GSM mobile‑station test set) and E7495B (rugged, portable base‑station test set). These platforms combine RF generators, analyzers and protocol/emulation applications for devices under test. Specialist instruments such as N5500A (phase‑noise test set) and 11729C (carrier noise test set) focus on noise and oscillator characterisation.
What distinguishes Keysight's test sets
Connector and frequency breadth: Keysight provides precision test ports (APC‑7 on several TR and S‑parameter sets) and microwave connectors (3.5 mm, 2.4 mm, SMA) to match VNA and fixture requirements; the VNA‑test‑set line reaches microwave and millimetre bands (examples: 8516A to 40 GHz, 8517B to 50 GHz).
Host integration and control: Many units are host‑controlled by a VNA or a PC (85047A, 85046A, 8514B and others rely on the host analyzer; faceless instruments such as N4010A require a PC virtual front panel). Communications platforms include network‑emulation lab applications or protocol stacks (E5515C as the 8960 Series 10 hardware platform, E8285A for CDMA/PCS/AMPS testing).
Field versus lab: Portable, battery‑equipped test sets for field base‑station work (E7495B) sit alongside bench and rack instruments for production and R&D. Where DC biasing is required, some TR/VNA test sets provide bias inputs (85046A rear‑panel BNC DC bias ports; 41952A includes a DC bias input with ±40 V limit).
Choosing the right Keysight test set
Match the device and measurement stack to the test‑set class:
- Frequency and connector: pick a test set whose stated frequency range and connector type align with the DUT and the host analyzer (e.g., choose 8516A or 8517B for measurements into tens of GHz; choose 85044A/85046A when an APC‑7 precision port is required).
- Function: use passive TR kits (87512A, 41952A) when you need simple transmission/reflection capability with the host analyzer; use full S‑parameter test sets (8514B, 8516A) for calibrated two‑port S‑parameter sweeps with higher directivity and switch architectures.
- Communications test requirements: pick a communications platform when you need base‑station emulation or protocol stacks — E5515C (8960 Series hardware) for multi‑technology cellular lab applications, E8285A for CDMA/PCS/AMPS functional test, and E6651A for Mobile WiMAX protocol and RF parametric measurements.
- Portability and field service: select an instrument with integrated batteries and on‑board RF analyzer/generator such as E7495B for on‑site base‑station installation and troubleshooting.
- Special measurements: choose dedicated noise/phase hardware for low‑noise oscillator or residual‑noise characterization (N5500A, 11729C) rather than a general‑purpose RF test set.
Also verify host‑control interfaces (GPIB, LAN, USB), required software options (for example N4010A’s software options for Bluetooth/WLAN test capability), and any DC‑bias or maximum input‑power requirements listed for the chosen test set.
Popular models
Frequently asked questions
- When should I use a passive TR kit versus a full S‑parameter test set?
- A passive TR kit (for example 87512A or 41952A) provides the basic transmission and reflection routing required by a compatible network or spectrum analyzer and is appropriate for simpler two‑port magnitude/phase checks. Full S‑parameter test sets (for example 8514B, 8516A, 8517B, 85046A) are intended for calibrated S‑parameter sweeps with higher directivity, internal switching or reference channels and are the right choice when you need accurate, bidirectional S‑parameter measurements over extended microwave frequency ranges.
- Which test sets are suitable for multiport VNA measurements?
- E5092A is the multiport test set that extends an E5071C ENA VNA: it supports up to 10‑port measurements with a single test set and up to 22 ports when two E5092As are used together with a 4‑port ENA.
- What options are relevant for field use and base‑station verification?
- Choose instruments that combine RF generation, analysis and field power options. E7495B is described as a rugged, portable base‑station test set with RF generator and analyzer coverage from 375 MHz to 2.7 GHz and dual internal rechargeable Li‑Ion batteries. For lab‑based base‑station emulation and protocol testing, platform hardware such as E5515C (8960 Series 10) supports a broad set of cellular technologies via lab applications.