The HP Keysight 4291A is a high-precision RF impedance and material analyzer designed for surface mount component evaluation and material testing. Operating across a broad frequency range of 1 MHz to 1.8 GHz, it provides highly accurate and repeatable impedance measurements from 0.1 ̩ to 50 k̩, featuring a built-in 7.5-inch color CRT display, equivalent circuit analysis, and optional DC bias capabilities.

Specifications

General

ParameterValue
InterfacesHP-IB (IEEE-488) supporting SH1, AH1, T6, TE0, L4, LE0, SR1, RL1, PP0, DC1, DT1, C1, C2, C3, C4, C11, E2
Display7.5-inch Color CRT, 512 x 400 resolution, 2 channels
Warm-Up Time30 minutes

Physical

ParameterValue
Power Supply90 V to 132 V / 198 V to 264 V, 47 Hz to 66 Hz, 500 VA max
Operating Temperature10 to 50 °C (Mainframe), 0 to 55 °C (Test Station)
Dimensions (W×H×D)426 mm × 234 mm × 537 mm (Mainframe), 275 mm × 95 mm × 205 mm (Test Station)
Weight24 kg (mainframe), 3.7 kg (test station)
Test Station Dimensions (W×H×D)275 mm × 95 mm × 205 mm
Test Station Weight3.7 kg
Test Station Cable Length1.5 m

Measurement Capabilities & Parameters

ParameterValue
Impedance Measurement Parameters|Z|, θz, |Y|, θy, R, X, G, B, Cp, Cs, Lp, Ls, Rp, Rs, D, Q, |Γ|, θγ, Γx, Γy
Impedance Measurement Range0.1 Ω to 50 kΩ
Connector TypeAPC-7

Stimulus AC Signal Characteristics

ParameterValue
Frequency Range1 MHz to 1.8 GHz
Frequency Resolution1 mHz
AC Voltage Signal Level Range0.2 mVrms to 1 Vrms
AC Current Signal Level Range4 µArms to 20 mArms
AC Power Level Range-67 dBm to 7 dBm

DC Bias Source

ParameterValue
DC Bias Voltage Range (Option 001)0 to ±40 V
DC Bias Current Range (Option 001)20 µA to 100 mA, -20 µA to -100 mA
DC Bias Voltage Resolution (Option 001)1 mV
DC Bias Current Resolution (Option 001)20 µA

Sweep & Measurement Speed

ParameterValue
Sweep Parameter SelectionFrequency, OSC level (voltage), DC bias voltage/current
Sweep Setup ModesStart/Stop, Center/Span
Sweep TypesLinear, Log, List
Sweep ModesContinuous, Single, Manual, Number of groups
Sweep DirectionUp sweep, Down sweep
Number of Sweep Points2 to 801 points
Averaging TypesSweep average, Point average
Sweep Delay FunctionsPoint delay time, Sweep delay time

Calibration & Compensation

ParameterValue
Calibration FunctionsOpen/Short/50 Ω calibration, Low loss calibration
Compensation FunctionsOpen/Short/Load compensation, Port extension, Electric length

Display & User Interface

ParameterValue
Display FormatsSingle, dual split, or overwrite; graphic or tabular
Trace Capacity1 trace/channel for measurement, 1 trace/channel for memory
Equivalent Circuit SimulationBuilt-in component equivalent circuit analysis
Limit Line TestingSupported (go/no-go testing)

Interfaces & Connectivity

ParameterValue
External Reference Input10 MHz (typical), >-5 dBm (typical)
External Trigger InputTTL level, pulse width >2 µs (typical)

Storage & Memory

ParameterValue
Disk Storage1.4 MB flexible disk drive (DOS and LIF compatible)
Internal MemoryRAM disk memory

Frequency

ParameterValue
Frequency Accuracy±20 ppm (at 23 °C ± 5 °C)
Frequency Reference Stability±10 ppm / year (standard); ±0.13 ppm / year (with Option 1D5)

Signal Source

ParameterValue
Source Level Resolution0.1 dB

Measurement Accuracy

ParameterValue
Basic Impedance Accuracy±0.8%

Performance

ParameterValue
Measurement Time15 ms per point (typical)

Storage

ParameterValue
Floppy Disk Drive Format3.5-inch, DOS (1.44 MB) and LIF formats

Environmental

ParameterValue
Non-Operating Temperature Range-40 °C to +70 °C
Operating Humidity15% to 95% RH
Operating AltitudeUp to 4,500 m

Interfaces

ParameterValue
External Video Output15-pin D-sub (VGA)
Keyboard PortMini-DIN
I/O Port25-pin D-sub (8-bit I/O port)

Measurement Setup

ParameterValue
Measurement Channels2 channels

System & Control

ParameterValue
Programming LanguagesSCPI, HP Instrument BASIC (IBASIC)

Measurement Parameters

ParameterValue
Material Measurement Parameters (Option 002)Complex permittivity (εr', εr''), Complex permeability (μr', μr''), loss tangent (tan δ)

Technology

RF Impedance Analyzer

Applications

Surface mount component evaluation, dielectric/magnetic material testing