The Keysight (Agilent) N4901B Serial BERT 13.5 Gb/s is an industry-leading bit error rate tester designed for high-performance serial bus characterization, transceiver testing, and semiconductor validation. Supporting data rates from 150 Mb/s to 13.5 Gb/s, the N4901B features integrated clock data recovery (CDR), advanced jitter injection capabilities, true differential inputs/outputs, and a comprehensive analysis measurement suite.
Specifications
General
| Parameter | Value |
|---|---|
| Interfaces | GPIB, LAN, USB, VGA |
| Display | 8.4-inch color LCD touch screen |
Physical
| Parameter | Value |
|---|---|
| Power Supply | 100 to 240 V AC, 50 to 60 Hz |
| Operating Temperature | 5 °C to 40 °C |
| Dimensions (W×H×D) | 424 mm x 222 mm x 570 mm |
System Architecture and Key Performance
| Parameter | Value |
|---|---|
| Minimum Data Rate | 150 Mb/s |
| Maximum Data Rate | 13.5 Gb/s |
| Upgrade Capabilities | Upgradeable from 7 Gb/s to 13.5 Gb/s |
| Operating Modes | Pattern Generator, Error Detector |
| Chassis Configuration | Integrated Mainframe |
Pattern Generator (TX) Specifications
| Parameter | Value |
|---|---|
| Output Data Rate Range | 150 Mb/s to 13.5 Gb/s |
| Output Transition Time (10% to 90%) | < 25 ps (20% to 80%) |
| Output Intrinsic Jitter | < 1 ps RMS (typical) |
| Output Amplitude Range | 0.1 V to 1.8 Vp-p (single-ended), 0.2 V to 3.6 Vp-p (differential) |
Error Detector (RX) Specifications
| Parameter | Value |
|---|---|
| Input Data Rate Range | 150 Mb/s to 13.5 Gb/s |
| Input Sensitivity (Differential) | < 50 mV pp |
| Input Interface Type | True differential inputs |
Clocking and Clock Recovery
| Parameter | Value |
|---|---|
| Integrated CDR Range 1 | 1.05 Gb/s to 1.6 Gb/s |
| Integrated CDR Range 2 | 2.11 Gb/s to 3.20 Gb/s |
| Integrated CDR Range 3 | 4.23 Gb/s to 6.40 Gb/s |
| Integrated CDR Range 4 | 9.9 Gb/s to 10.9 Gb/s |
Jitter Injection and Tolerance
| Parameter | Value |
|---|---|
| Jitter Modulation Range | 200 ps |
| Jitter Modulation Frequency Range | DC to 1 GHz |
Analysis and Software Features
| Parameter | Value |
|---|---|
| Operating System | Windows XP |
| Measurement Suite Capabilities | Bathtub curve, output level, Q-factor, spectral jitter decomposition, fast eye mask, error location capture |
Pattern Generator
| Parameter | Value |
|---|---|
| PRBS Patterns | 2^7-1, 2^10-1, 2^11-1, 2^15-1, 2^23-1, 2^31-1 |
| User Pattern Memory | 1 bit to 32,768,000 bits |
| PG Delay Control Range | -750 ps to +750 ps |
| Output Crossing Point Adjustment Range | 20% to 80% |
Clock and Delay
| Parameter | Value |
|---|---|
| Clock Output Frequency Range | 150 MHz to 13.5 GHz (option-dependent) |
| Clock Output Amplitude Range | 0.1 Vp-p to 2.0 Vp-p (single-ended) |
| Sub-rate Clock Divider Ratios | 2, 4, 8, 16 |
Error Detector
| Parameter | Value |
|---|---|
| Error Detector Input Impedance | 50 Ω (nominal) |
| Error Detector Input Voltage Range | -2.0 V to +3.0 V |
Environmental
| Parameter | Value |
|---|---|
| Storage Temperature Range | -40 °C to +70 °C |
Generator Parameters
| Parameter | Value |
|---|---|
| PG Output Offset Range | -2.00 V to +3.00 V |
| PG Output Termination Voltage Range | -2.00 V to +3.00 V |
| PG Output Transition Time (20% to 80%) | < 25 ps (20 ps typical) |
| PG Clock Output Offset Range | -2.00 V to +3.00 V |
| PG External Clock Input Frequency | 150 MHz to 13.5 GHz |
| PG External Clock Input Amplitude | 200 mVpp to 2.0 Vpp |
Analyzer Parameters
| Parameter | Value |
|---|---|
| ED Clock Input Frequency Range | 150 MHz to 13.5 GHz |
| ED Data Input Threshold Range | -2.00 V to +3.00 V |
| ED Data Input Threshold Resolution | 1 mV |
| ED Clock-to-Data Delay Resolution | 100 fs |
| ED Auto-align Capabilities | Threshold and phase auto-alignment |
Error Insertion
| Parameter | Value |
|---|---|
| Error Insertion Rate Range | 1.0 × 10^-2 to 1.0 × 10^-9 |
Sync & Trigger
| Parameter | Value |
|---|---|
| Pattern Sync Output Amplitude | 1 V nominal into 50 Ω |
| Trigger Output Amplitude | 1 V nominal into 50 Ω |
Technology
Bit Error Rate Testing (BERT)
Applications
High-speed digital transceiver characterization, semiconductor design validation, telecom/datacom system testing