N6760 Series - 50W, 100W Modules

Keysight Technologies (Agilent HP)Agilent HP

The Keysight (Agilent) N6761A and N6762A are 50 W and 100 W precision DC power supply modules within the N6760 Series, designed for the N6700 and N6705 modular power system mainframes. They offer highly accurate control and readback in the milliampere and microampere regions, featuring simultaneous voltage and current digitizing capabilities.

Specifications

Physical

ParameterValue
Operating Temperature0 °C to 55 °C

Output Ratings

ParameterValue
Maximum Output Power50 W (N6761A); 100 W (N6762A)
Output Voltage Range0 to 50 V
Output Current Range0 to 1.5 A (N6761A); 0 to 3 A (N6762A)
Voltage Low Range5.5 V
Current Low Range100 mA

Programming Accuracy

ParameterValue
Voltage Programming Accuracy0.016% + 6 mV
Current Programming Accuracy0.04% + 200 µA
Voltage Low Range Accuracy0.016% + 1.5 mV
Current Low Range Accuracy0.04% + 15 µA

Measurement/Readback Accuracy

ParameterValue
Voltage Readback Accuracy0.016% + 6 mV
Current Readback Accuracy0.04% + 160 µA
Voltage Low Range Readback Accuracy0.016% + 1.5 mV
Current Low Range Readback Accuracy0.03% + 15 µA
Microamp Range Measurement Accuracy0.5% + 100 nA (with Option 2UA)

Ripple and Noise

ParameterValue
Voltage Peak-to-Peak Ripple (20 Hz to 20 MHz)4.5 mV
Voltage RMS Ripple0.35 mV
Current RMS Ripple2 mA

Dynamic Characteristics

ParameterValue
Output Turn-on Delay Range0 to 3600 s
Output Turn-off Delay Range0 to 3600 s

Output Protections

ParameterValue
Overvoltage Protection (OVP) Range0 to 55 V

Features and Options

ParameterValue
Current Measurement Low Range OptionOption 2UA (200 µA range)
Output Disconnect Relays OptionOption 761
Polarity Reversal Relays OptionOption 760 (includes disconnect relays)
Galvanic IsolationYes (Output to chassis and between outputs)

Physical and Environmental

ParameterValue
Module Slot Width1 slot
Mainframe CompatibilityKeysight N6700, N6701, N6702, N6705 Series

Technology

Precision Programmable DC Power Supply

Applications

Automated Test Equipment (ATE), low-power device testing, battery emulation, simultaneous V/I digitizing