The Rohde & Schwarz FSEM30 is a high-performance spectrum analyzer from the FSE Series, designed for ultra-wide dynamic range measurements and universal analysis of analog and digital modulated signals. Operating from 20 Hz to 26.5 GHz, this instrument is widely utilized in aerospace, defense, and telecommunications testing.
Specifications
General
| Parameter | Value |
|---|---|
| Display | 24 cm (9.5") active color TFT LCD |
Frequency Specifications
| Parameter | Value |
|---|---|
| Frequency Range | 20 Hz to 26.5 GHz |
| Frequency Span Range | 0 Hz, 10 Hz to 26.5 GHz |
Amplitude and Level Specifications
| Parameter | Value |
|---|---|
| Maximum RF Input Level | +30 dBm (1 W) |
| Maximum DC Input Voltage | 0 V (DC coupled), 50 V (AC coupled) |
| Input Attenuation Range | 0 dB to 70 dB |
| Input Attenuation Step Size | 10 dB |
Sweep and Trigger Specifications
| Parameter | Value |
|---|---|
| Sweep Time Range (Span = 0 Hz) | 1 µs to 2500 s |
| Sweep Points | 500 |
Bandwidth Specifications
| Parameter | Value |
|---|---|
| Resolution Bandwidth (RBW) Range | 1 Hz to 10 MHz |
| Video Bandwidth (VBW) Range | 1 Hz to 10 MHz |
| FFT Filter Bandwidth Range | 1 Hz to 1 kHz |
Inputs and Outputs (RF & Analog)
| Parameter | Value |
|---|---|
| RF Input Impedance | 50 Ω |
| External Reference Input Frequency | 10 MHz |
| External Reference Output Frequency | 10 MHz |
Demodulation and Analysis
| Parameter | Value |
|---|---|
| AF Demodulation Types | AM and FM |
Options and Hardware Configurations
| Parameter | Value |
|---|---|
| High Stability Reference Option | FSE-B4 (OCXO) |
| Vector Signal Analysis Option | FSE-B7 |
Measurement
| Parameter | Value |
|---|---|
| Detectors | Max Peak, Min Peak, Auto Peak, Sample, RMS, Average |
Storage
| Parameter | Value |
|---|---|
| Floppy Disk Drive | 3.5 inch, 1.44 MB |
Control
| Parameter | Value |
|---|---|
| Command Set | SCPI |
Technology
Superheterodyne Spectrum Analysis / Digital Signal Processing
Applications
High-frequency spectrum monitoring, digital/analog demodulation, and RF component characterization