The Tektronix DSA70804C is a high-performance Digital Serial Analyzer (oscilloscope) featuring an 8 GHz bandwidth, up to 25 GS/s real-time sample rate across all 4 channels, and advanced serial analysis software integrated as standard. It is engineered to deliver exceptional signal fidelity and comprehensive analysis for high-speed serial data standards.

Specifications

General

ParameterValue
InterfacesGPIB, LAN (10/100/1000 Base-T, LXI Class C), USB 2.0 host (5 ports), USB device, Auxiliary Input, Auxiliary Output, Reference Clock Input, Reference Clock Output, DVI-I Out
Display12.1 in. (307 mm) Liquid Crystal Active Matrix Color TFT touchscreen, 1024 × 768 pixels (XGA)
Warm-up Time20 minutes
LXI ComplianceLXI Class C Version 1.3

Physical

ParameterValue
Power Supply100 to 240 V AC ±10% at 50 to 60 Hz, or 115 V AC ±10% at 400 Hz; <1200 VA maximum
Operating Temperature5 to 45
Dimensions (W×H×D)451 × 298 × 489
Weight24

Vertical System - Analog Channels

ParameterValue
Analog Bandwidth (-3 dB)8 GHz
Calculated Rise Time (10% to 90%)54 ps
Calculated Rise Time (20% to 80%)39 ps
Number of Input Channels4
Input CouplingDC, GND
Input Impedance50 Ω ±1.5%
Input Sensitivity Range10 mV/div to 1 V/div
Vertical Resolution8-bit (>11-bit in Hi-Res)
DC Gain Accuracy±2% of full scale
Offset Range±1 V at 10 mV/div to 99.5 mV/div; ±10 V at 100 mV/div to 1 V/div

Horizontal System

ParameterValue
Timebase Range20 ps/div to 1000 s/div
Timebase Accuracy±1.5 ppm (initial accuracy)
Channel-to-Channel Deskew Range±75 ns
Timebase Delay Time Range-5.0 s to 250 s
Internal Reference Frequency10 MHz

Acquisition System

ParameterValue
Maximum Real-Time Sample Rate25 GS/s on all 4 channels
Maximum Record Length (Standard)31.25 Mpts per channel
Maximum Record Length (Optional)up to 250 Mpts (option-dependent)
Waveform Capture Rate>300,000 wfm/s (FastAcq mode)
Acquisition ModesSample, Peak Detect, Averaging, Envelope, Hi-Res, FastAcq, Waveform Database

Trigger System

ParameterValue
Trigger SourcesCh 1, Ch 2, Ch 3, Ch 4, Auxiliary In, Line
Trigger ModesAuto, Normal, Single
Trigger CouplingDC, AC, HF Rej, LF Rej, Noise Rej
Trigger Holdoff Range250 ns to 12 s
Standard Trigger TypesEdge, Glitch, Width, Runt, Window, Timeout, Transition (Rise/Fall), Pattern, State, Setup/Hold, Sequence
Advanced / Protocol Trigger TypesComm Trigger, Serial Pattern Trigger (up to 6.25 Gb/s with hardware recovery)
Trigger Jitter<100 fs RMS (typical with Enhanced Triggering)

Waveform Measurements and Analysis

ParameterValue
Automatic Measurements53 automatic measurements
Waveform Math OperatorsBasic, Advanced, Equation Editor
FFT Window TypesRectangular, Hamming, Hanning, Kaiser-Bessel, Blackman-Harris, Gaussian, Flattop2, TekExponential
Jitter and Eye Diagram AnalysisDPOJET Jitter & Eye Diagram Analysis (Standard)
Limit / Mask TestingStandard

Display and User Interface

ParameterValue
Waveform Display FormatsYT, XY

Environmental and Compliance

ParameterValue
Storage Temperature Range-30 °C to +60 °C
Operating Humidity8% to 80% RH (non-condensing)
Operating Altitude3,000 m (9,843 ft.)

Physical Characteristics

ParameterValue
Form FactorBenchtop (rackmount kit available)

Vertical System

ParameterValue
Maximum Input Voltage150 mV RMS at <50 mV/div, 1.2 V RMS at ≥50 mV/div
Channel-to-Channel Isolation≥100:1 at ≤100 MHz, ≥30:1 at >100 MHz to 2.5 GHz, ≥15:1 at >2.5 GHz to 8 GHz
Vertical Position Range±5 divisions

Computer System

ParameterValue
Operating SystemWindows 7 Ultimate (64-bit)

Compliance

ParameterValue
Safety ComplianceUL 61010-1, CAN/CSA-C22.2 No. 61010-1, EN 61010-1, IEC 61010-1

Inputs & Outputs

ParameterValue
Input ConnectorsTekConnect

Serial Analysis

ParameterValue
Hardware Clock Recovery Range1.5 MBaud to 3.125 GBaud
Pattern Triggering Data RateUp to 6.25 Gbps

PC System

ParameterValue
System Memory8 GB
Storage DriveRemovable HDD, ≥160 GB

Acquisition

ParameterValue
Equivalent Time Sample RateUp to 5 TS/s

Technology

Digital Phosphor / Digital Serial Analyzer (DSA)

Applications

High-speed serial bus verification, characterization, and compliance testing

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