The Tektronix TDS6154C is a high-performance 15 GHz digital storage oscilloscope in the TDS6000 Series, engineered for advanced debug, compliance testing, and high-speed serial data analysis.
Specifications
General
| Parameter | Value |
|---|---|
| Interfaces | USB 2.0 (front panel), 1000Base-T Ethernet (LAN), GPIB (IEEE 488.2) |
| Display | 10.4-inch (264 mm) active-matrix color TFT LCD, 1024 × 768 (XGA) |
Physical
| Parameter | Value |
|---|---|
| Power Supply | 100 to 240 V AC ±10% (47 to 63 Hz), 115 V AC ±10% (360 to 440 Hz), <1000 VA power consumption |
| Operating Temperature | 5 °C to 40 °C |
| Dimensions (W×H×D) | 451 mm × 282 mm × 505 mm |
| Weight | 20.4 kg |
Vertical System
| Parameter | Value |
|---|---|
| Analog Bandwidth | 15 GHz |
| Input Channels | 4 |
| Vertical Resolution | 8 bits (>11 bits with averaging) |
| Rise Time (10% to 90%) | 28 ps (typical) |
| Rise Time (20% to 80%) | 19 ps (typical) |
| Input Coupling | 50 Ω: DC |
| Input Impedance | 50 Ω |
| Input Sensitivity Range | 10 mV/div to 1 V/div |
| DC Gain Accuracy | ±2% |
| Maximum Input Voltage | 1.5 V RMS (with TekConnect 50 Ω) |
| Channel-to-Channel Isolation | ≥15:1 at 15 GHz |
| Offset Range | ±1.5 V (10 to 100 mV/div), ±5 V (101 mV to 1 V/div) |
| Position Range | ±5 div |
Horizontal System
| Parameter | Value |
|---|---|
| Real-Time Sample Rate (2 Channels) | 40 GS/s |
| Real-Time Sample Rate (4 Channels) | 20 GS/s |
| Maximum Record Length | Up to 64 MS on all 4 channels (configuration/option dependent) |
| Timebase Range | 5 ps/div to 40 s/div |
| Timebase Delay Range | -5.0 div to 250 s |
| Channel-to-Channel Deskew Range | ±75 ns |
Trigger System
| Parameter | Value |
|---|---|
| Trigger Modes | Auto, Normal, Single |
| Trigger Holdoff Range | 250 ns to 12 s |
| Pinpoint Triggering Combinations | Over 1400 combinations |
| Serial Pattern Triggering Rate | Up to 3.125 Gb/s (with 8b/10b protocol triggering) |
Computer System & Storage
| Parameter | Value |
|---|---|
| Operating System | Windows XP |
| Removable Storage | Front-panel CD-R/W drive |
Connectivity & Interface Ports
| Parameter | Value |
|---|---|
| Probe Interface | TekConnect |
Power & Environmental
| Parameter | Value |
|---|---|
| Non-Operating Temperature | -22 °C to +60 °C |
| Operating Humidity | 20% to 80% RH (non-condensing) |
| Operating Altitude | Up to 3,000 m (10,000 ft) |
Ordering Information & Options
| Parameter | Value |
|---|---|
| Standard Warranty | 1 year |
Performance
| Parameter | Value |
|---|---|
| Timebase Accuracy | ±15 ppm |
| Timebase Aging | ±1 ppm/year |
| Trigger Jitter | 1.5 ps RMS (typical) |
| Acquisition Modes | Sample, Average, Envelope, Waveform Database |
| Number of Math Waveforms | 4 |
Inputs & Outputs
| Parameter | Value |
|---|---|
| Internal Reference Output | 10 MHz |
| External Reference Input | 10 MHz |
| Calibrator Output | 1 V into ≥10 kΩ (500 mV into 50 Ω), 1 kHz square wave |
Triggering
| Parameter | Value |
|---|---|
| Trigger Types | Edge, Glitch, Width, Runt, Timeout, Transition, Setup/Hold, Window, Pattern, State, Comm (option dependent), Serial Pattern (option dependent) |
| Trigger Sensitivity | 0.5 div (DC to 2 GHz), 1.0 div (2 GHz to 5 GHz), 2.0 div (5 GHz to 10 GHz), 3.0 div (10 GHz to 15 GHz) |
| Trigger Level Range (Internal) | ±12 divisions from center of screen |
| Trigger Level Range (Auxiliary) | ±5 V |
| Auxiliary Trigger Input | 50 Ω, BNC connector, 5 V RMS maximum input voltage |
Measurements
| Parameter | Value |
|---|---|
| Waveform Math | Add, subtract, multiply, divide, integrate, differentiate, FFT, user-defined equations |
| Cursor Measurements | Amplitude, Time, Screen, Waveform |
Power
| Parameter | Value |
|---|---|
| Power Consumption | 950 W maximum (1150 VA) |
Environmental
| Parameter | Value |
|---|---|
| Acoustic Noise | 52 dBA |
| Operating Vibration | 0.22 g RMS (5 to 500 Hz) |
| Non-Operating Vibration | 2.28 g RMS (5 to 500 Hz) |
| Operating Shock | 10 g (11 ms, half-sine) |
Technology
Digital Storage Oscilloscope (DSO)
Applications
High-Speed Serial Data Analysis, Design Validation, Jitter Analysis, Compliance Testing