The Tektronix TDS820 is a 2-channel, 8 GHz digital sampling oscilloscope engineered for high-bandwidth, high-speed signal analysis. Designed for precise characterization of fast transitions, it features a 14-bit vertical resolution, a versatile horizontal system with sweep speeds from 20 ps/div to 2 ms/div in 5 ps steps, a low 3 ps RMS jitter, and an external trigger bandwidth of 2 GHz. It is fully GPIB programmable and offers advanced capabilities like optional DSP waveform math and a variety of persistence display modes.
Specifications
General
| Parameter | Value |
|---|---|
| Display | Infinite and variable persistence displays |
Physical
| Parameter | Value |
|---|---|
| Power Supply | 90 to 250 V AC RMS, 45 to 440 Hz, 300 W maximum |
| Operating Temperature | 0 to +50 °C |
| Dimensions (W×H×D) | 445 mm × 193 mm × 448 mm |
| Weight | 10.1 kg |
Vertical System
| Parameter | Value |
|---|---|
| Analog Bandwidth (-3 dB) | 6 GHz |
| Number of Input Channels | 2 |
| Vertical Resolution (ADC) | 14-bit |
| Input Impedance | 50 Ω |
| Input Coupling | DC |
| Vertical Sensitivity Range | 2 mV/div to 200 mV/div |
| Rise Time | ≤ 58.3 ps |
Horizontal System
| Parameter | Value |
|---|---|
| Sweep Speeds (Time Base Range) | 20 ps/div to 2 ms/div |
| Record Length | 500 to 15,000 points |
| Sampling Mode | Equivalent-Time Random Sampling |
Trigger System
| Parameter | Value |
|---|---|
| External Trigger Bandwidth | 2 GHz |
| Standard Trigger Frequency Range | DC to 2 GHz |
| Enhanced Trigger Frequency Range (Option 1T) | DC to 8 GHz |
Waveform Measurements and Analysis
| Parameter | Value |
|---|---|
| Automatic Measurements | 27 |
| Advanced DSP Waveform Math | Optional (includes FFT, Integration, and Differentiation) |
Environmental
| Parameter | Value |
|---|---|
| Maximum Operating Altitude | 4,500 m (15,000 ft) |
Options
| Parameter | Value |
|---|---|
| Option 1F | 3.5-inch MS-DOS compatible floppy disk drive |
| Option 1R | Rackmount kit |
Technology
Digital Sampling
Applications
High-speed digital design, optical communications testing, and semiconductor characterization
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